Exploring the performance of a dielectric elastomer generator through numerical simulations

Srivastava, Arpit Kumar; Basu, S.

doi:10.1016/j.sna.2020.112401

Cited by 5 publications

(2 citation statements)

References 18 publications

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“…Previous studies have shown that the dielectric constant can indeed be affected by external strain [12][13][14][15][16][17][18]. For example, Vu-Cong et al [19] and Wissler et al [20] experimentally found that the dielectric constant of VHB4910 decreased at stretching deformation. However, traditional approach of determining the dielectric constant upon stretching is ex situ and clumsy.…”

Section: Introductionmentioning

confidence: 98%

Strain Effect on Dielectricity of Elastic Thermoplastic Polyurethanes

Wang,

Yang,

Xie

et al. 2024

Preprint

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Dielectric elastomers, such as thermoplastic polyurethanes (TPU), are widely used as dielectric layer, emulation layer and substrate of flexible and stretchable devices. To construct capacitors and actuators that work stably upon deformation, it has become an urgent need to investigate the evolution of dielectricity under stress and strain. However, the lack of effective methods for estimating the dielectric constant of elastomers under strain poses a big challenge. This article reports a device for in-situ measuring the dielectric constant of TPU under strain. It is found that upon stretching TPU to a strain of 400%, its dielectric constant decreases from 8.47 to 2.94. In addition, combined Fourier-transform infrared spectroscopy, X-ray scattering technique, and atomic force microscopy have been utilized to characterize the evolution of microstructure under strain. The investigation under tensile strain reveals that a decreased density and average size of polarized hard domains, along with a tendency of the molecular chains to align in parallel with the tensile stress. The evolution of the microstructures results in a reduction of the dielectric constant parallel to the electric field in TPU. Our work provides valuable experimental reference for improving the stability of flexible sensors and actuators based on dielectric elastomers.

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Section: Introductionmentioning

confidence: 98%

Strain Effect on Dielectricity of Elastic Thermoplastic Polyurethanes

Wang,

Yang,

Xie

et al. 2024

Preprint

View full text Add to dashboard Cite

show abstract

“…Previous studies have shown that the dielectric constant can indeed be affected by an external strain [ 12 , 13 , 14 , 15 , 16 , 17 , 18 ]. For example, Vu-Cong et al [ 19 ] and Wissler et al [ 20 ] experimentally found that the dielectric constant of VHB4910 decreased at stretching deformation. However, the traditional approach for determining the dielectric constant upon stretching is ex situ and clumsy.…”

Section: Introductionmentioning

confidence: 99%

Strain Effect on Dielectricity of Elastic Thermoplastic Polyurethanes

Wang,

Yang,

Xie

et al. 2024

Polymers

View full text Add to dashboard Cite

Dielectric elastomers, such as thermoplastic polyurethanes (TPUs), are widely used as the dielectric layer, encapsulation layer, and substrate of flexible and stretchable devices. To construct capacitors and actuators that work stably upon deformation, it has become urgent to investigate the evolution of dielectricity under stress and strain. However, the lack of effective methods for estimating the dielectric constant of elastomers under strain poses a big challenge. This study reports a device for the in situ measurement of the dielectric constant of TPU under strain. It is found that upon stretching TPU to a strain of 400%, its dielectric constant decreases from 8.02 ± 0.01 to 2.88 ± 0.25 (at 1 MHz). In addition, combined Fourier-transform infrared spectroscopy, the X-ray scattering technique, and atomic force microscopy were utilized to characterize the evolution of the microstructure under strain. The investigation under tensile strain reveals a decreased density and average size of polarized hard domains, along with a tendency of the molecular chains to align in parallel with the tensile stress. The evolution of the microstructures results in a reduction in the measured dielectric constant in TPU.

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