Exploring the Impact of Functional Test Programs Re-Used for Power-Aware Testing

Abstract

Physical Unclonable Functions are emerging cryptographic primitives used to implement low-cost device authentication and secure secret key generation. In this paper we propose an innovative design based on STT-MRAM memory. We exploit the high variability affecting the electrical resistance of the MTJ device in anti-parallel magnetization. We will show that the proposed solution is robust, unclonable and unpredictable.

Intelligent design automation for 2.5/3D heterogeneous SoC integration

“…Hence, our goal is to bridge the gap between the test and functional modes. Many techniques have been reported to generate functional-like test patterns by mimicking the switching activity characteristics [34,36] or using reachable states as the scan-in flip-flop values [24,29,30,33,42]. However, neither approach is a comprehensive solution: switching activity is only part of the system behavior that affects test quality while reachability analysis is an NP-complete problem and cannot be scaled without significantly sacrificing the model accuracy.…”

“…• Reachability modeling. The idea is to ensure that the scan-in states are reachable or close to reachable states [24,29,30,33,42]. Since reachability analysis is an NP-complete problem, one has to trade model accuracy for computation complexity.…”

LFSR‐based generation of boundary‐functional broadside tests

“…As a result, a fault-free circuit may fail a scan-based delay test, resulting in overtesting [1][2][3]. Overtesting is addressed by test generation procedures that create functional or close-to-functional operation conditions during their functional capture cycles [1][2][3][4][5][6][7][8][9][10][11][12][13][14][15][16][17]. These clock cycles are important since delay faults are detected during these clock cycles.…”

On‐chip generation of primary input sequences for multicycle functional broadside tests

“…Scan-based tests for delay faults that maintain functional operation conditions are referred to as functional broadside tests. In [4][5][6][7][8][9], such tests are computed for circuits that are embedded in a larger design. Other types of tests that attempt to achieve close-to-functional operation conditions are described in [10][11][12][13].…”