2017
DOI: 10.1002/adma.201702729
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Exploring the Charge Transport in Conjugated Polymers

Abstract: Conjugated polymers came to an unprecedented epoch that the charge transport is limited only by small disorder within aggregated domains. Accurate evaluation of transport performance is thus vital to optimizing further molecule design. Yet, the routine method by means of the conventional field-effect transistors may not satisfy such a requirement. Here, it is shown that the extrinsic effects of Schottky barrier, access transport through semiconductor bulk, and concurrent ambipolar conduction seriously influenc… Show more

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Cited by 76 publications
(60 citation statements)
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“…An important feature in all these highest performing polymers is a degree of energetic disorder that is on the order of ~k B T (refs. [55][56][57] ). The energetic disorder can be quantified, for example, by determining the Urbach energy, which is a measure of the width of the tail of the optical absorption near the bandgap.…”
Section: Charge Transport In Low-disorder Conjugated Polymersmentioning
confidence: 99%
“…An important feature in all these highest performing polymers is a degree of energetic disorder that is on the order of ~k B T (refs. [55][56][57] ). The energetic disorder can be quantified, for example, by determining the Urbach energy, which is a measure of the width of the tail of the optical absorption near the bandgap.…”
Section: Charge Transport In Low-disorder Conjugated Polymersmentioning
confidence: 99%
“…Measured Schottky barrier values range from 0.1 to 1 eV at interfaces between metals and organic semiconductors . One common method to determine the Schottky barrier is to directly measure EA, IP, and WF using photoelectron spectroscopy (PES).…”
Section: Charge Injection Through a Metal–semiconductor Interfacementioning
confidence: 99%
“…Although contact doping is an effective method to improve contact injection in silicon‐based devices, a long‐standing problem for application in organic‐based devices is the unintentional diffusion into the channel region that leads to higher off‐current . A recently reported method helps to solve this problem by confining the dopants near the source‐drain contacts.…”
Section: Optimization Of Nonideal Ofetsmentioning
confidence: 99%