2023
DOI: 10.21203/rs.3.rs-2865543/v1
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Exploring the association between EEG microstates during resting-state and error-related activity in young children

Abstract: The error-related negativity (ERN) is a negative deflection in the electroencephalography (EEG) waveform at frontal-central scalp sites that occurs after error commission. The relationship between the ERN and broader patterns of brain activity measured across the entire scalp that support error processing during early childhood is unclear. We examined the relationship between the ERN and EEG microstates – whole-brain patterns of dynamically evolving scalp potential topographies that reflect periods of synchron… Show more

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