2013
DOI: 10.1016/j.infrared.2013.09.004
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Exploring novel methods to achieve sensitivity limits for high operating temperature infrared detectors

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Cited by 7 publications
(6 citation statements)
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“…[5][6][7][8] Despite considerable success has been achieved by semiconductor, the generation-recombination noise in the photodetector limits further improvement of the device performance. 9,10 Therefore, the exploration of alternative system remains crucial in optoelectronic detection. Semimetal is a kind of material with high carrier concentration and low carrier mobility compared to those of semiconductor, which is generally considered unsuitable for high sensitivity of photodetection due to the shortcomings of low responsivity and high noise.…”
Section: Introductionmentioning
confidence: 99%
“…[5][6][7][8] Despite considerable success has been achieved by semiconductor, the generation-recombination noise in the photodetector limits further improvement of the device performance. 9,10 Therefore, the exploration of alternative system remains crucial in optoelectronic detection. Semimetal is a kind of material with high carrier concentration and low carrier mobility compared to those of semiconductor, which is generally considered unsuitable for high sensitivity of photodetection due to the shortcomings of low responsivity and high noise.…”
Section: Introductionmentioning
confidence: 99%
“…Variation of voltage offset with IRT ambient temperature is of particular concern when using uncooled detectors [6]. A mechanical chopper, or shutter, can be used to overcome of 10 drift within IRTs to improve their stability [7,8] but at the expense of increasing the overall instrument cost and size. In addition, IRTs incorporating mechanical chopping also need detectors with lower shunt capacitance.…”
Section: Introductionmentioning
confidence: 99%
“…Infrared thermometers intended for accurate temperature measurements at low signal intensity use techniques to improve the accuracy and stability of the measurements acquired [ 6 , 30 ], typically: optical chopping of the incoming radiation to provide intermittent dark current measurement, thereby, affording offset compensation; thermoelectric cooling of the sensor to minimize the detector dark current and its drift, and increase the photodiode shunt resistance.…”
Section: Introductionmentioning
confidence: 99%
“…Accommodating these features necessitates an increased thermometer enclosure size and additional electronics for controlling the cooling and undertaking additional signal processing [ 30 ]. Development of an infrared thermometer that used an uncooled sensor and received the radiant signal without optical chopping, but had the capability of measuring machine tool temperatures, would advance machining tool temperature measurement [ 8 , 11 ].…”
Section: Introductionmentioning
confidence: 99%