2009
DOI: 10.1063/1.3151691
|View full text |Cite
|
Sign up to set email alerts
|

Exploring dark current voltage characteristics of micromorph silicon tandem cells with computer simulations

Abstract: The transport mechanisms controlling the forward dark current-voltage characteristic of the silicon micromorph tandem solar cell were investigated with numerical modeling techniques. The dark current-voltage characteristics of the micromorph tandem structure at forward voltages show three regions: two with an exponential dependence and a third where the current grows more slowly with the applied voltage. In the first exponential region the current is entirely controlled by recombination through gap states of t… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
4
1

Citation Types

2
11
0

Year Published

2009
2009
2018
2018

Publication Types

Select...
8

Relationship

0
8

Authors

Journals

citations
Cited by 19 publications
(13 citation statements)
references
References 34 publications
2
11
0
Order By: Relevance
“…The comparison is shown in Table 2 in brackets with asterisks. We note that the values of references [24,25] are quite close to what we have assumed for our μc-Si:H:F I-layer. In particular the effective DOS in the valence and conduction bands; as well as the tail prefactors G D0 , G A0 are similar to ours and an order of magnitude lower than those normally assumed for hydrogenated amorphous silicon and also assumed for the low (A) and intermediate (B) F c μc-Si:H I-layers here, for reasons to be justified in Section 6.…”
Section: Experimental Results and Analysissupporting
confidence: 86%
See 2 more Smart Citations
“…The comparison is shown in Table 2 in brackets with asterisks. We note that the values of references [24,25] are quite close to what we have assumed for our μc-Si:H:F I-layer. In particular the effective DOS in the valence and conduction bands; as well as the tail prefactors G D0 , G A0 are similar to ours and an order of magnitude lower than those normally assumed for hydrogenated amorphous silicon and also assumed for the low (A) and intermediate (B) F c μc-Si:H I-layers here, for reasons to be justified in Section 6.…”
Section: Experimental Results and Analysissupporting
confidence: 86%
“…Only the capture cross-sections of the dangling bond states are more than two orders of magnitude higher than our case. Probably this had to be assumed for the HWCVD μc-Si I-layers [24,25] since the current density from these devices (13−16 mA cm −2 −22) is much lower than ours (23.20 mA cm −2 ) for comparable values of the absorption coefficients. On the other hand, our average mid gap defect density is the same and their capture cross-sections in the highest F c μc-Si:H I-layer are much closer to the values extracted from modeling the dark J-V characteristics of PECVD μc-Si I layers in reference [22].…”
Section: Experimental Results and Analysismentioning
confidence: 77%
See 1 more Smart Citation
“…Among the tandem PV devices proposed, c-Si-based tandem PV devices have attracted considerable research interests due to their low cost, top sub-cells with tunable optoelectronic properties, and a possible efficiency of as high as 33% in a bifacial configuration 2,3 . To achieve high performance in these tandem solar cells, providing an excellent tunneling-recombination-junction is one of the most important design criteria 46 . Another key criterion involves the appropriate choice of top and bottom sub-cells, so that current matching among these sub-cells exists with the same short-circuit current density (J sc ) 5 .…”
Section: Introductionmentioning
confidence: 99%
“…12,13 If the leakage paths in top cell can be eliminated and the optimized tunneling recombination junction (TRJ) layer is adopted, higher V oc can be obtained. 14,15 The initial efficiency of the single-junction a-Si cells used in this work was around 9.8% with a V oc of 0.91 V, a J sc of 14.7 mA/cm 2 , and a FF of 74%. For all experiments in this work, the light-induced degradation was stabilized after at least 5 days at AM1.5 exposure under the open-circuit condition.…”
Section: Samples and Experimentsmentioning
confidence: 99%