Exploiting sensor and process characteristics to tackle label scarcity in AIoT sensing

Luo, Wenjie

doi:10.32657/10356/169116

DOI: 10.32657/10356/169116

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Exploiting sensor and process characteristics to tackle label scarcity in AIoT sensing

Wenjie Luo¹

Abstract: A special thanks to CNCL lab manager Toh Leong Teck for his willingness to go above and beyond to ensure that our experimental needs are met. His expertise and dedication have been invaluable to the success of my research projects.

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Exploiting sensor and process characteristics to tackle label scarcity in AIoT sensing

Abstract: A special thanks to CNCL lab manager Toh Leong Teck for his willingness to go above and beyond to ensure that our experimental needs are met. His expertise and dedication have been invaluable to the success of my research projects.

Cited by 0 publications

References 77 publications

No citations

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