2019
DOI: 10.1002/inf2.12025
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Exploitation of Bi2O2Se/graphene van der Waals heterojunction for creating efficient photodetectors and short‐channel field‐effect transistors

Abstract: The formation of heterojunction within solid‐state devices enables them with eventually high performances, but provides a challenge for material synthesis and device fabrication because strict conditions such as lattice match are needed. Herein, we show a facile method to fabricate a van der Waals (vdW) heterojunction between two‐dimensional (2D) bismuth oxyselenide (Bi2O2Se) and graphene, during which the graphene is directly transferred to the Bi2O2Se and served as a low‐contract‐resistant electrode with sma… Show more

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Cited by 37 publications
(29 citation statements)
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“…Hence, it is urgent to develop novel prototype devices that can break the thermionic limit of SS to achieve sub-60 mV dec −1 . [3,4] To this end, several steep-slope device systems such as nanoelectromechanical FETs (NEMFETs), [5,6] tunnel FETs (T-FETs), [7,8] Dirac-source FETs (DS-FETs), [9] impact ionization FETs (II-FETs), [10] and negativecapacitance FETs (NC-FETs) [11][12][13][14][15][16][17][18] have been proposed and developed to realize sub-60 mV dec −1 SS potentially. For instance, compared with MOSFET, normal dielectric materials are replaced by ferroelectric/dielectric systems in NC-FETs to achieve low SS below 60 mV dec −1 under the condition of capacitance matching.…”
Section: Doi: 101002/adma202005353mentioning
confidence: 99%
“…Hence, it is urgent to develop novel prototype devices that can break the thermionic limit of SS to achieve sub-60 mV dec −1 . [3,4] To this end, several steep-slope device systems such as nanoelectromechanical FETs (NEMFETs), [5,6] tunnel FETs (T-FETs), [7,8] Dirac-source FETs (DS-FETs), [9] impact ionization FETs (II-FETs), [10] and negativecapacitance FETs (NC-FETs) [11][12][13][14][15][16][17][18] have been proposed and developed to realize sub-60 mV dec −1 SS potentially. For instance, compared with MOSFET, normal dielectric materials are replaced by ferroelectric/dielectric systems in NC-FETs to achieve low SS below 60 mV dec −1 under the condition of capacitance matching.…”
Section: Doi: 101002/adma202005353mentioning
confidence: 99%
“…Because of the absorption of both BP and Bi 2 O 2 Se to infrared light, R reaches ∼ 9.5 A/W, ∼ 4.3 A/W and ∼ 2.3 A/W at 850 nm, 1330 nm and 1550 nm, respectively. This is at a superior level among the BP or Bi 2 O 2 Se based photovoltaic photodetectors, as summarized in Figure4(f)[27][28][29][30][31][32][33][34][35][36][37][38]. Whilst D* is calculated to be ∼ 5.3 × 10 9 Jones, ∼ 2.4 × 10 9 Jones and ∼ 1.…”
mentioning
confidence: 90%
“…[5,12] Recently, the emergence of photodetectors based on 2D materials has opened up an avenue to circumvent the abovementioned dilemma owing to their free surface dangling bonds. [13,14] In addition, 2D materials usually have atomic thickness, [15] high specific surface area, [16] and strong light-matter interaction, [17] which can provide high responsivity and photoconductive gain in nanoscale photodetectors. [18][19][20][21][22] Such 2D materials Exploring 2D ultrawide bandgap semiconductors (UWBSs) will be conductive to the development of next-generation nanodevices, such as deep-ultraviolet photodetectors, single-photon emitters, and high-power flexible electronic devices.…”
mentioning
confidence: 99%