Explanation of the quasi-harmonic field emission behaviour observed on epoxy-coated polymer graphite cathodes

Knápek, Alexandr; Allaham, Mohammad M.; Burda, D; Sobola, Dinara; Drozd, Michal; Horáček, Miroslav

doi:10.1016/j.mtcomm.2022.105270

Cited by 4 publications

(12 citation statements)

References 25 publications

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“…This allows a possible connection between the aromatic rings (or even possible destruction of the ring bonds), forming larger molecular capacitors, and a higher probability for the stored electrons to alternate between the joint rings through a possible broken C–H or C–O bond. This assumption explains the switch-on phenomenon, thermionic energy distribution, and the focused electron beam of CFE from metallic-epoxy composites. , …”

Section: Resultsmentioning

confidence: 91%

“…This assumption explains the switch-on phenomenon, thermionic energy distribution, and the focused electron beam of CFE from metallic-epoxy composites. 4,23 Supporting the XPS analysis, the normalized Raman spectrum was measured and is presented in Figure 6(a). The results are equivalent to previously reported spectra for DGEBA epoxy resin precursor after curing.…”

Section: ■ Materials and Methodologymentioning

confidence: 99%

“…The film surface was etched by a 10 keV Ar500+ beam to ensure a clean measuring spot without contamination. Thus, an average value for ϕ and ψ was obtained using the following equations: ϕ = 21.22 − E SECO − E normalF ψ = ϕ + E HOMO …”

Section: Methodsmentioning

confidence: 99%

“…The coating layer acts like a tunneling layer that separates the metal-vacuum interface. Moreover, it protects the cathode surface from unwanted environmental factors affecting the emission process, such as ion bombardments on its surface. , …”

Section: Introductionmentioning

confidence: 99%

“…The results showed unique switch-on behavior (sudden emission currents of intense current densities) of the emission process that depends on the thickness of the applied layer, and the resulting electron beam was more concentrated, higher in brightness, operating at lower threshold voltages, having different energy distributions and different current–voltage characteristics. However, the mechanism behind the changes in the typical characteristics of a CFE process is still not fully understood. − …”

Section: Introductionmentioning

confidence: 99%

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Comprehensive Analysis of E478 Single-Component Epoxy Resin and Tungsten-E478 Interface for Metallic-Polymer Composite Electron Source Applications

Allaham

2024

ACS Omega

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This study provides comprehensive elemental, optical, and energy gap characteristics of the E478 singlecomponent epoxy resin. This type of epoxy resin has imperative applications in medium voltage insulation and cold field emission of electrons. X-ray photoelectron spectroscopy (XPS), Raman spectroscopy, and hydrogen nuclear magnetic resonance (1H-NMR) were used to study the elemental and structural analyses, ultraviolet photoelectron spectroscopy (UPS) was used to obtain the local work function and the ionization potential energies, and ultraviolet/visible light spectroscopy (UV/VIS) was used to report the optical and energy gap characteristics of the epoxy resin being studied. Moreover, the UPS and UV/VIS analyses were merged to obtain the electron affinity of the E478 epoxy resin and to study the epoxy's energy band diagram and the tungsten-epoxy interface band structure. The results showed that the E478 epoxy resin is considered an n-type semiconductor of energy gap ∼3.94 eV, local work function ∼3.42 eV, ionization potential ∼6.10 eV, electron affinity ∼2.16 eV, and tungsten-epoxy Schottky contact barrier height ∼2.50 eV.

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Section: Resultsmentioning

confidence: 91%

Section: ■ Materials and Methodologymentioning

confidence: 99%

Section: Methodsmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

See 3 more Smart Citations

Comprehensive Analysis of E478 Single-Component Epoxy Resin and Tungsten-E478 Interface for Metallic-Polymer Composite Electron Source Applications

Allaham

2024

ACS Omega

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Integrated silicon electron source for high vacuum microelectromechanical system devices

Krysztof,

Miera,

Urbański

et al. 2024

Journal of Vacuum Science &Amp; Technology B

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The article presents the process of developing a silicon electron source designed for high-vacuum microelectromechanical system (HV MEMS) devices, i.e., MEMS electron microscope and MEMS x-ray source. Technological constraints and issues of such an electron source are explained. The transition from emitters made of carbon nanotubes to emitters made of pure silicon is described. Overall, the final electron source consists of a silicon tip emitter and a silicon gate electrode integrated on the same glass substrate. The source generates an electron beam without any carbon nanotube coverage. It generates a high and stable electron current and works after the final bonding process of an HV MEMS device.

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Field emission characteristics and analysis of chargé flow through graphite based cathodes

Allaham¹,

Burda²,

Sobola³

et al. 2023

Proceedings II of the 29st Conference STUDENT EEICT 2023: Selected Papers.

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This paper studies the performance of different types of graphite cathodes when operated as field emission electron sources. The tested cathodes were prepared in the form of bulk polymer graphite, bulk pure graphite, and polymer graphite coated with thin layer of insulating material (epoxy resin). The obtained results include X-Ray photoelectron spectroscopy analysis, scanning electron micrographs, the field emission microscope patterns and current-voltage characteristics, and the orthodoxy test analysis results. The importance of this study is summarized in following the pursuit of finding cheap and green electron sources. Moreover, to present a new exotic field emission behavior in the form of emission pulses.

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Explanation of the quasi-harmonic field emission behaviour observed on epoxy-coated polymer graphite cathodes

Cited by 4 publications

References 25 publications

Comprehensive Analysis of E478 Single-Component Epoxy Resin and Tungsten-E478 Interface for Metallic-Polymer Composite Electron Source Applications

Comprehensive Analysis of E478 Single-Component Epoxy Resin and Tungsten-E478 Interface for Metallic-Polymer Composite Electron Source Applications

Integrated silicon electron source for high vacuum microelectromechanical system devices

Field emission characteristics and analysis of chargé flow through graphite based cathodes

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