2014
DOI: 10.1016/j.solmat.2013.06.015
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Explanation of potential-induced degradation of the shunting type by Na decoration of stacking faults in Si solar cells

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Cited by 281 publications
(225 citation statements)
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“…17 Naumann et al investigated Si solar cells after PID stress at a nanoscale level. 3,18 They proposed the shunting mechanism of Na-decorated stacking faults (SFs) to explain the failure performance in a Si solar cell. Ziebarth et al found that Na atoms elongate the Si-Si bonds across the SF and create a 2D conductive layer calculated using the first principle calculation.…”
Section: Resultsmentioning
confidence: 99%
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“…17 Naumann et al investigated Si solar cells after PID stress at a nanoscale level. 3,18 They proposed the shunting mechanism of Na-decorated stacking faults (SFs) to explain the failure performance in a Si solar cell. Ziebarth et al found that Na atoms elongate the Si-Si bonds across the SF and create a 2D conductive layer calculated using the first principle calculation.…”
Section: Resultsmentioning
confidence: 99%
“…[2][3][4][5][6] This is because the local electrical short-circuiting of the pn-junction in a Si solar cell occurs under high voltage stress, which leads to a substantial reduction in the power of a module.…”
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confidence: 99%
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“…누설 전류에 의 하여 Na 이온이 태양전지 표면까지 이동하게 되는 상 황을 예상할 수 있고 이 관점에서 Na 이온의 PID 영향 성에 대한 연구가 진행되고 있다. [13][14][15][16][17][18][19] J. Bauer, V. Naumann 등은 모듈에 전압을 인가한 후 Time-of-flight Secondary ion mass spectroscopy(ToF-SIMS)를 이용하여 PID 이후 Na 이온에 의해 에미터 특 성이 변할 수 있음을 제안하였다. ( Fig.…”
Section: )unclassified
“…테스 트 동안 누설전류를 측정하고, PID가 일어나는 셀을 이 용하여 충진재와 유리 비교 실험을 간편하게 시행이 가 능하다. [17][18][19]26) 3. PID 해결 방안 PID에 의한 모듈 출력 감소를 막기 위하여 다양한 방 법이 제시되었다.…”
Section: )unclassified