Experimentations on scan chain encryption with PRESENT

Silva, Mathieu Da; Flottes, Marie-Lise; Natale, Giorgio Di; Rouzeyre, Bruno

doi:10.1109/ivsw.2017.8031543

Cited by 5 publications

(9 citation statements)

References 18 publications

(18 reference statements)

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“…Several countermeasures to the scan attacks have been reported in the literature [10]- [15] to ensure the confidentiality of the exchanged test data between the tester and the circuit, while preserving the use of the test interface for authorized users. These solutions are applied to the existing test infrastructure by inserting two ciphers in the circuit.…”

Section: B Test Data Encryptionmentioning

confidence: 99%

“…The pseudo-random sequence, used as keystream, is generated with a Non-Linear Feedback Shift Register (NLFSR) from an 80-bit secret key and an 80-bit IV. The TRIVIUM stream cipher encrypts the test interfaces of JTAG in [10], IEEE 1500 in [12] and IJTAG in [13], while the PRESENT block cipher is used to encrypt the scan chain in [14] [15]. We will see the pros and cons of each encryption method in the next section.…”

Section: B Test Data Encryptionmentioning

confidence: 99%

“…The content of the applied test vectors and the produced responses is not disrupted by the additional encryption/decryption steps. Concerning the test of the ciphers themselves, authors in [14] [15] showed that the extra logic introduced for encryption is tested in the same time as the test data are processed. Therefore, there is no impact on the original test coverage even with the implementation of the ciphers.…”

Section: B Testing Costmentioning

confidence: 99%

“…This results in higher overhead than the stream-based solutions. However, an optimization is proposed in [14] [15], based on an alternative DfT approach that makes the scan chain length multiple of the block size. Block ciphers have thus to be adapted to cope with the serial interface of the testing infrastructures.…”

Section: B Testing Costmentioning

confidence: 99%

See 3 more Smart Citations

Encryption of test data: which cipher is better?

Silva

Valea

Flottes

et al. 2018

2018 14th Conference on Ph.D. Research in Microelectronics and Electronics (PRIME)

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Testing is a mandatory step in the Integrated Circuit (IC) production because it ensures the required quality of the devices. The most common solution for easing IC testing is the scan chain insertion. This way, a tester can control and observe the internal states of the circuit through dedicated pins. However, a malicious user can exploit this infrastructure in order to extract secret information stored inside the chip. This is the case for cryptographic circuits where partially encrypted results can be observed by shifting out the scan chain content and exploited to retrieve secret keys. Existing countermeasures consist in encrypting the scan content, ensuring the confidentiality of the exchanged messages between the circuit and the tester. The encryption techniques that have been proposed so far rely on the use of two different ciphers: stream ciphers and block ciphers. In this paper, we present pros and cons of both solutions in terms of security and performance. The purpose is to provide an overview of the state-of-the-art in test data encryption and to give elements of comparison between the two ciphers.

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Section: B Test Data Encryptionmentioning

confidence: 99%

Section: B Test Data Encryptionmentioning

confidence: 99%

Section: B Testing Costmentioning

confidence: 99%

Section: B Testing Costmentioning

confidence: 99%

See 2 more Smart Citations

Encryption of test data: which cipher is better?

Silva

Valea

Flottes

et al. 2018

2018 14th Conference on Ph.D. Research in Microelectronics and Electronics (PRIME)

Self Cite

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show abstract

“…Stream ciphers have traditionally been the preferred solution for such test data encryption. This is due to their smaller area footprint and their easier management for serial encryption compared to block ciphers [6] [7].…”

Section: Introductionmentioning

confidence: 99%

A New Secure Stream Cipher for Scan Chain Encryption

Silva

Valea

Flottes

et al. 2018

2018 IEEE 3rd International Verification and Security Workshop (IVSW)

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The accessibility to the internal IP cores of Systems on Chip (SoC) provided by the testing infrastructures is a serious security threat. It has been known for many years that the scan chains can be exploited to retrieve secret keys of cryptoprocessors. Encryption of the scan chain content is one of the proposed techniques to overtake this threat. Many proposals are based on stream ciphers, due to their moderate area cost compared to that of block ciphers. Stream ciphers encrypt data serially with a keystream generated from an Initialization Vector (IV) and a secret key. Stream ciphers have a crucial limitation concerning the encryption of different data with the same keystream, called two times pad. Not enough caution in the IV and secret key management has been exercised in previous proposed works. In this paper, we show how the existing implementations can be exploited to perform a scan attack bypassing the encryption of the scan data. We also present a new implementation of scan chain encryption with a stream cipher, based on the IV generation by a True Random Number Generator (TRNG). Finally, we show that this new implementation is robust against the aforementioned attack.

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Scan Chain Based Attacks and Countermeasures: A Survey

et al. 2019

IEEE Access

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Scan chains increase the testability but decrease security. Attackers may use scan chains to launch attacks to obtain sensitive information, which poses serious security threats. The scan chain-based attacks contain two steps: 1) scan data obtaining, including mode switching obtaining method and test mode only obtaining method, and 2) scan data analysis, including data mapping analysis method and signature analysis method. To prevent these attacks, various secure scan designs have been proposed. These designs are summarized into two categories: scan chain modification and scan input/output restriction. This paper gives a survey of the scan chain-based attacks and countermeasures. The secure scan designs are summarized and compared from the aspects of security, testability, test time, and hardware overhead.INDEX TERMS Scan chain based attacks, test mode, mode switch, signature, secure scan chain, secret key, physical unclonable function.

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Experimentations on scan chain encryption with PRESENT

Cited by 5 publications

References 18 publications

Encryption of test data: which cipher is better?

Encryption of test data: which cipher is better?

A New Secure Stream Cipher for Scan Chain Encryption

Scan Chain Based Attacks and Countermeasures: A Survey

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