Experimentally obtained and computer-simulated X-ray non-coplanar 18-beam pinhole topographs for a silicon crystal

Abstract

Non-coplanar 18-beam X-ray pinhole topographs for a silicon crystal were computer simulated by fast Fourier transforming the X-ray rocking amplitudes that were obtained by solving the n-beam (n = 18) Ewald–Laue dynamical theory (E-L&FFT method). They were in good agreement with the experimentally obtained images captured using synchrotron X-rays. From this result and further consideration based on it, it has been clarified that the X-ray diffraction intensities when n X-ray waves are simultaneously strong in the crystal can be computed for any n by using the E-L&FFT method.

Experimentally obtained and computer-simulated X-ray asymmetric eight-beam pinhole topographs for a silicon crystal

“…n z is the downward surface normal of the exit surface (but not the entrance surface as discussed later) of the crystal. 4 in Okitsu et al (2019) (hereafter denoted OIY 2019). 1(b) and 1(c) are ½111 and ½211, respectively, as shown in the upper-right corner of Fig.…”