Abstract:Accurate determination of electronic transport properties of individual transparent conductive oxide layers, namely indium tin oxide (ITO), is essential for further development and design of photonic devices with ITO layer as a tunable ultrafast optoelectronic component. Precise magnetotransport measurements are here implemented to achieve carrier mobility distribution that gives insight into types and characteristics of carrier species. ITO thin films with various sheet resistance of ≈10, 75, and 350 Ω sq−1, … Show more
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