1995
DOI: 10.1007/bf02522945
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Experimental verification of reverse order of diagnostic X-ray beam quality in voltage-ripple dependence

Abstract: It has been generally expected that, as X-ray tube-voltage ripple increases, the X-ray spectrum shifts to the low photon-energy side, and therefore the mean energy decreases, i.e. the beam quality is softened. This is the normal order. Previous calculation (Birch et al., 1979), however, showed that the beam quality generated by 100% ripple was harder than that by 50% ripple. This is the reverse order, against general expectation. To verify the reverse order, X-ray spectra are measured using a germanium detecto… Show more

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Cited by 7 publications
(3 citation statements)
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“…Storm et al, 6 Israel et al, 7 Seelentag and Panzer, 8 and Birch and Marshall 9 introduced another experimental method for direct measurement of x-ray spectra using nuclear detectors such as NaI and Ge, References 6-9͒ worked under the real operating conditions of an x-ray machine, but required unsuitable geometries for pile up due to the high counting rates; they needed sourcedetector distances of up to several meters and very narrow collimation of the beam. A collection of spectra from 10 to 300 kVp have been published by Seelentag et al 10 and from 30 to 150 kVp by Birch et al 11 We [12][13][14][15][16] are experimentally investigating the spectra emitted from x-ray tubes by using Ge detector systems.…”
Section: Introductionmentioning
confidence: 99%
“…Storm et al, 6 Israel et al, 7 Seelentag and Panzer, 8 and Birch and Marshall 9 introduced another experimental method for direct measurement of x-ray spectra using nuclear detectors such as NaI and Ge, References 6-9͒ worked under the real operating conditions of an x-ray machine, but required unsuitable geometries for pile up due to the high counting rates; they needed sourcedetector distances of up to several meters and very narrow collimation of the beam. A collection of spectra from 10 to 300 kVp have been published by Seelentag et al 10 and from 30 to 150 kVp by Birch et al 11 We [12][13][14][15][16] are experimentally investigating the spectra emitted from x-ray tubes by using Ge detector systems.…”
Section: Introductionmentioning
confidence: 99%
“…We obtained the x-ray photon spectra incident on the front screen per mAs mm 2 for a tube voltage of 80 kV by using a method similar to our previous work (Arimura et al 1994). The x-ray photon spectra per mAs mm 2 were measured by means of our x-ray spectrum measuring system (Ozaki et al 1993, Matsumoto et al 1995, and were corrected by using the stripping method (Seelentag and Panzer 1979). We consider that the measured x-ray spectra are the spectra averaged over a wide area of the screen.…”
Section: Number Of X-ray Photons Incident On the Screensmentioning
confidence: 99%
“…However, the method introduced above has a drawback in that it does not take the voltage fluctuation ( 12 , 13 ) into consideration. It only utilizes the model spectra at a preset voltage, and we therefore refer to it as the single-voltage method.…”
Section: Introductionmentioning
confidence: 99%