“…A bright-field TEM image of the interface of the 5201:1 sample with its selected area electron diffraction (SAED) pattern (inset) is shown in Figure a. The SAED pattern exhibits a polycrystalline ring-like electron pattern, indicating the presence of amorphous features at the nitrided layer–GLC film interface. , Further analysis shows that the SAED pattern contains the diffraction rings of Fe 4 N and Fe 3 N, corresponding to the (111) and (210) planes of Fe 4 N and (202), (211), and (113) planes of Fe 3 N, respectively, consistent with the XRD results. The HRTEM images of the interfacial microregions of the 5203:1, 5201:1, and 5201:3 samples with the corresponding inverse fast Fourier transform (FFT) results (as inserted) are shown in Figure b–d, respectively.…”