Experimental studies on the X-ray single-pulse jitter at the SSRF

The Dynamics of Plasmon-Induced Hot Carrier Creation in Colloidal Gold

“…The lifetimes of the hot carriers were determined from a single exponential decay to be 498 ± 35 fs with complete carrier thermalisation occurring within 1.5 ps. These time constants align with previous postulations 24 but are here substantiated through direct measurement. The con rmed ultrafast hot carrier dynamics in plasmonic nanoparticles are the primary bottleneck in plasmonic applications.…”

“…The transient signal directly demonstrates the generation of hot carriers through LSPR decoherence via Landau damping (the non-radiative pathway dominant in small nanoparticles). 21,24,40 Most notably, the hot hole and electron signals are neither symmetric nor have the same integrated magnitude. This is related to the XANES higher sensitivity to empty states formation and the L 3 -edge transition changes in the d-shell that is part of the valence, where the hot holes are formed.…”

“…Transient XAS (aka time-resolved XAS (TR-XAS)) probes empty states around theFermi energy and, in the case of d 10 metals with the L 3 -edge transition, provides direct information about the amount of carrier participation and their nonequilibrium energy distributions. 23 At synchrotrons, such dynamical measurements are typically hampered by limited temporal resolution (~ 5 ps) and photon density, 24 impeding real-time observations of the hot carrier generation process. 8 However, this limitation has been surpassed by the advent of hard X-ray free electron lasers (XFELs), 25 capable of delivering intense and ultrashort hard X-ray pulses (up to 30 keV at the European XFEL 26 and 12 keV at SwissFEL (used in this study) 27 ) of less than 50 fs in duration.…”

“…In this particular case, it was estimated to be 24.6 ± 6 fs, corroborating that plasmon decoherence occurs between 10-100 fs. 24 Following plasmon damping, the hot carriers undergo a carrier multiplication reaching a maximum at 105 ± 8 fs, estimated from rising edge analysis. The lifetimes of the hot carriers were determined from a single exponential decay to be 498 ± 35 fs with complete carrier thermalisation occurring within 1.5 ps.…”

Picosecond time-resolved X-ray ferromagnetic resonance measurements at Shanghai synchrotron radiation facility

“…As the electron beams in the storage ring increase their energy, the electron beam introduced by the accelerator merges with the electron beam already in the storage ring, resulting in timing jitter. In recent experimental measurements of the X-ray single-pulse timing jitter at the SSRF [35], the single X-ray pulse timing jitter was quantified as 4.8 ps (RMS).…”