Experimental Stark halfwidths of the ionized oxygen and silicon spectral lines

Measurement of Stark Halfwidths of Spectral Lines of Ionized Oxygen and Silicon Emitted from T-tube Plasma

“…The presence of O II, Si II and Si III spectral lines in our experiments was first observed in the spectra emitted from the T-tube while using pure helium as the working gas [34,35]. Oxygen and silicon occur in our plasma as impurities originating from the glass walls of the discharge vessel.…”

“…The plasma was produced in an electromagnetically driven T-tube [35,36]. The T-tube consists of a glass vessel with an internal radius of 27 mm with electrodes placed in the vertical part of the tube.…”

“…The cross section of the T-tube is given in Figure 2. Since the plasma is produced in a T-tube, which operates on the principle of shockwave propagation in a glass tube, oxygen and silicon appear in the plasma due to an ablation of the glass walls of the tube [35].…”

“…Most of the glass wall ablation occurs in the corners where the horizontal and vertical parts of the tube are joined [35], due to the impact of the incident shock wave front. The ablated silicon and oxygen atoms and ions are carried by the moving plasma toward the reflector.…”

“…The intention of this paper is to give a comprehensive analysis of all experimental results of spectral line halfwidths presented in [35] and give more details about the experiment used in [35].…”