Experimental quantification of annular dark-field images in scanning transmission electron microscopy

LeBeau, James M.; Stemmer, Susanne

doi:10.1016/j.ultramic.2008.07.001

Cited by 230 publications

(148 citation statements)

References 23 publications

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“…When HAADF-STEM image simulations are carried out, all the experimental conditions of the electron microscope are taken into account, such as: acceleration voltage, defocus, coma, astigmatism, spherical aberration, chromatic aberration, probe size, convergence angle, annular detector range, and specimen thickness. In addition to the quantitative analysis of HAADF-STEM image simulations the elastic scattering and the incoherent thermal diffuse scattering (TDS) are necessary to be considered 30 and also the map of the annular dark field detector recorded as a function of the position of the scanned incident electron probe 31 . The contribution of Bragg reflections is minimized and TDS becomes the most important contribution to image intensity 32 .…”

Section: Introductionmentioning

confidence: 99%

Study of PtPd Bimetallic Nanoparticles for Fuel Cell Applications

et al. 2017

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Bimetallic nanoparticles are of special interest for their potential applications for fuel cells, mainly for portable power applications. Among the bimetallic systems, Pt-Pd bimetallic nanoparticles have received great interest as they can be widely used as effective catalysts for various electrochemical reactions. In this work, Pt-Pd alloy bimetallic nanoparticles were synthesized through a chemical reduction method. The nanoparticles were characterized using aberration-corrected scanning/transmission electron microscopy (STEM). Also, parallel beam X-Ray diffraction analysis was carried out to evaluate the crystallographic structure. High-angle annular dark field (HAADF)-STEM images of the Pt-Pd bimetallic nanoparticles were obtained. The contrast of the images shows that the nanoparticles have an alloy structure with an average size of 7.15 nm. To understand the properties of the bimetallic nanoparticles, it is necessary to know the distribution of the elements in the nanostructure. We have used a semi-quantitative method to analyze the HAADF-STEM images, which allowed us to measure the total intensity of the scattered electrons for each atomic column. HAADF-STEM images of the Pt-Pd bimetallic nanoparticles were compared directly with image simulations, good agreement between simulation and experimental images was found. Cyclic voltammetry studies were carried out to analyze the electrochemical behavior of the bimetallic nanoparticles.

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Section: Introductionmentioning

confidence: 99%

Study of PtPd Bimetallic Nanoparticles for Fuel Cell Applications

et al. 2017

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“…All images analyzed had a 1024 Â 1024 frame size recorded at the same magnification, with a dwell time of 30 s to reduce effects from drift, while retaining a high signal-to-noise ratio. Centroid positions of each atom column were determined using a custom MATLAB algorithm [22]. Position averaged convergent beam electron diffraction (PACBED) [23] was used for precise tilt alignment.…”

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confidence: 99%

Symmetry Lowering in Extreme-Electron-Density Perovskite Quantum Wells

et al. 2013

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“…However, quantitative matching between experimental and simulated aberrationcorrected Z-contrast images has not been reached up to now. The inclusion of spatial incoherence has been shown to give quantitative agreement between nonaberration-corrected HAADF-STEM images and theoretical simulations [20,21]. It is shown here that, using the same approach, a significant improvement in the correlation between calculated and experimental normalized integrated intensities is obtained in the InAs x P 1 x ternary semiconductor alloy, but residual discrepancies still remain [22].…”

Section: Simulation Of Integrated Intensitiesmentioning

confidence: 58%

High-Resolution Electron Microscopy of Semiconductor Heterostructures and Nanostructures

Sales

Beltrán

Lozano

et al. 2012

Semiconductor Research

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This chapter briefly describes the fundamentals of high-resolution electron microscopy techniques. In particular, the Peak Pairs approach for strain mapping with atomic column resolution, and a quantitative procedure to extract atomic column compositional information from Z-contrast high-resolution images are presented. It also reviews the structural, compositional, and strain results obtained by conventional and advanced transmission electron microscopy methods on a number of III-V semiconductor nanostructures and heterostructures.

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Experimental quantification of annular dark-field images in scanning transmission electron microscopy

Cited by 230 publications

References 23 publications

Study of PtPd Bimetallic Nanoparticles for Fuel Cell Applications

Study of PtPd Bimetallic Nanoparticles for Fuel Cell Applications

Symmetry Lowering in Extreme-Electron-Density Perovskite Quantum Wells

High-Resolution Electron Microscopy of Semiconductor Heterostructures and Nanostructures

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