The surface roughness of reservoirs detected by AFM is
typically
employed to predict the wettability of a sandstone reservoir. However,
the resulting predictive relationship represents the surface roughness
in only the intragranular region due to the limitations of the AFM
probe. For a long time, the detection of surface roughness in the
intergranular region, especially that of a sandstone reservoir treated
with an external stimulus, has not attracted much attention. This
paper proposed an in situ AFM and SEM method for measuring the surface
roughness in the different regions of tight sandstone treated with
an electric field, further revealing the wettability alteration from
a pore-scale perspective. The results show that the electric field
exposure increases the surface roughness in the intragranular and
intergranular regions, synthetically strengthening the water-wetness
of tight sandstone. Notably, pore parameter changes in the intragranular
region differ from those in the intergranular region. Pore length
decreases in the intragranular region and also in the intergranular
region, and pore number remains unchanged in the intragranular region
but decreases in the intergranular region. Moreover, pore depth increases
in the intragranular region but decreases in the intergranular region.
The movement of clay minerals induced by the electric field accounts
for the difference in the roughness alteration in the two regions.
This paper sheds light on new ways to approach surface roughness measurement
that can greatly improve the understanding of the relationship between
surface roughness and wettability of reservoirs. In addition, the
work presented in this paper may be vital in determining the surface
roughness of homogeneous materials treated by external stimulation.