Experimental investigation of the effect of the internal space charge accumulation on the electron emission yield of insulators submitted to e-irradiation: application to polycrystalline MgO

Belhaj, Mohamed; Tondu, Thomas; Inguimbert, Virginie

doi:10.1088/0022-3727/42/14/145306

Cited by 25 publications

(20 citation statements)

References 20 publications

(36 reference statements)

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“…15, 118-124 or using an hemispherical collector all around the system. 104,[125][126][127][128][129][130] All methods have been used and, with some care, produce very similar results.…”

Section: Experimental For Sey Studiesmentioning

confidence: 99%

Electron cloud in accelerators

Cimino

Demma

2014

Int. J. Mod. Phys. A

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Low energy electrons in accelerators are known to interact with the circulating beam, giving rise to the formation of a so-called e − cloud. Such e − cloud may induce detrimental effects on the accelerated beam quality and stability. Those effects have been observed in most accelerators of positively charged particles. A longstanding effort has been so far devoted to understand in detail the physical origin of such e − cloud, its build-up and its interaction with the circulating beam. We will first describe the origin and the basic features causing e − cloud formation in accelerators, then we review some of the theoretical work produced to simulate and analyze such phenomenon. In selected cases, theoretical expectations and experimental observations will be compared, to address the importance of benchmarking codes versus observations to reach the required predictive capability. To this scope, codes need realistic input parameters which correctly describe material and surface properties at the basis of such e − cloud formation and build-up. The experimental efforts, performed worldwide in many surface and material science laboratories, to measure such essential parameters will then be presented and critically reviewed. Finally, we will describe some of the e − cloud mitigation strategies adopted so far and draw some conclusions.

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“…15, 118-124 or using an hemispherical collector all around the system. 104,[125][126][127][128][129][130] All methods have been used and, with some care, produce very similar results.…”

Section: Experimental For Sey Studiesmentioning

confidence: 99%

Electron cloud in accelerators

Cimino

Demma

2014

Int. J. Mod. Phys. A

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“…In contrast to the first procedure, here the trapped charge is really compensated with the injection of charges with opposite sign. Experiments were performed on a polycrystalline MgO (2mm thick and 20mm in diameter) [40] to check which of the two methods is more reliable. First, the initial value of σ for 200 eV primary electron beam was measured, which turned out to be around 3.4.…”

Section: Indirect Methodsmentioning

confidence: 99%

Experimental investigation of electron emission from dielectric surfaces due to primary electron beam: a review

Chvyreva

Pemen

2014

IEEE Trans. Dielect. Electr. Insul.

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When charged particles impact the surface of a solid material, they can be backscattered from that surface or cause secondary electrons to be emitted. The ratio of the number of emitted electrons (secondary and backscattered) to the incident electrons number is known as the total electron emission yield. Knowledge of this total electron emission yield (TEEY) is highly required in various modern technologies, and several experimental techniques were developed with the purpose of its determination. However, experimental data, obtained with different methods are not in good agreement and sometimes are even contradictive. The purpose of this paper is to review the existing experimental methods of investigating electron emission (EE) from dielectric surfaces, as well as to analyze their accuracy and reliability. The focus is on the processes of the emission from thick layers of insulators which is the case for modern high voltage technologies.

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“…6,7 Many efforts have been made for charge neutralization and SEY measurement of insulators. [8][9][10][11][12][13][14][15][16][17][18][19][20] The measurement system with two electron guns could eliminate or weaken charge accumulation. [12][13][14][15] In addition to a pulsed electron gun for SEY measurement, the other low-energy (less than several eV) flood one was used to neutralize positive charges accumulated on the sample surface.…”

mentioning

confidence: 99%

“…Measurements based on a single pulsed electron gun were also reported. [16][17][18][19] Here, the PE energy E pe alternated for negative and positive charging, respectively, for charge compensation, and a Kelvin probe was simultaneously used to detect the potential variation at the sample surface so that positive charges could be effectively neutralized. These charge neutralization approaches are naturally sophisticated and of high cost, in spite of higher accuracy for SEY measurement.…”

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confidence: 99%

Note: A simple charge neutralization method for measuring the secondary electron yield of insulators

Weng

Cao

Zhao

et al. 2014

Review of Scientific Instruments

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We report on a simple and effective charge neutralization method for measuring the total electron-induced secondary electron yield of insulators in a measurement system with a single pulsed electron gun. In this method, the secondary electron collector is negatively biased with respect to the sample to force some emitted secondary electrons to return to the sample surface and therefore to neutralize positive charges accumulated in the sample during the previous measurement. The adequate negative bias is determined and the equilibrium state of negative charging is discussed. The efficacy of the method is demonstrated by the measured electron yields in the cases with and without charge neutralization and by comparison with existing electron yield data of polyimide.

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Experimental investigation of the effect of the internal space charge accumulation on the electron emission yield of insulators submitted to e-irradiation: application to polycrystalline MgO

Cited by 25 publications

References 20 publications

Electron cloud in accelerators

Electron cloud in accelerators

Experimental investigation of electron emission from dielectric surfaces due to primary electron beam: a review

Note: A simple charge neutralization method for measuring the secondary electron yield of insulators

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