2008
DOI: 10.12693/aphyspola.113.1091
|View full text |Cite
|
Sign up to set email alerts
|

Experimental Investigation of Resistive Sensor for High Power Millimetre Wave Pulse Measurement

Abstract: An experimental investigation of a high power millimetre wave pulse sensor is presented. Two groups of sensors with a flat frequency response were fabricated according to results of the optimisation. The frequency response and voltage standing wave ratio were measured and compared with results of the electrodynamical simulations. The largest measured sensitivity variation of the best sensors within waveguide frequency range was ±8%. The reasonable agreement between measured and simulated values of the sensitiv… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1

Citation Types

1
2
0

Year Published

2016
2016
2019
2019

Publication Types

Select...
1
1

Relationship

0
2

Authors

Journals

citations
Cited by 2 publications
(3 citation statements)
references
References 4 publications
1
2
0
Order By: Relevance
“…The power range of the microwave pulse is 0.1-1.4 kW, a little larger than the warm electron region of the semiconductor. There is a highly linear regression correlation between the output voltage U s and the input power P in of the hot carrier detector in this region [13]. On the one hand, the experimental results verify this linear relationship, which proves that the measurement results of the hot carrier detectors are reliable.…”
Section: Measurement System Experimentssupporting
confidence: 58%
See 2 more Smart Citations
“…The power range of the microwave pulse is 0.1-1.4 kW, a little larger than the warm electron region of the semiconductor. There is a highly linear regression correlation between the output voltage U s and the input power P in of the hot carrier detector in this region [13]. On the one hand, the experimental results verify this linear relationship, which proves that the measurement results of the hot carrier detectors are reliable.…”
Section: Measurement System Experimentssupporting
confidence: 58%
“…This power range belongs to the thermal electronic area of the semiconductor. The output voltage U s and the input power P in are satisfied with the quadratic dependence in this area [13,27]. The calibrated data in Fig.…”
Section: Measurement System Experimentsmentioning
confidence: 61%
See 1 more Smart Citation