“…the much-used TPP-2 M formula [14,15]; y is the electron emission angle with respect to the surface and O(hn, x, y), which is equivalent once integrated over x and y to the spectrometer intensity response function, can be determined from reference-sample calibration measurements [16]. For excitation energies in the keV regime, if not even below this, non-dipole or retardation corrections are needed for a fully accurate description of ds Qn'j ðhn;Þ=dO, as first demonstrated by Krause [17], and discussed in much more detail elsewhere [18]. Illustration of a typical experimental configuration for photoelectron spectroscopy experiments, together with the various types of measurements possible, including: (a) simple spectra or energy-distribution curves, (b) core-level photoelectron diffraction, (c) valence-band mapping or energy vsk plots, (d) spin-resolved spectra, (e) exciting with incident X-rays such that there is total reflection and/or a standing wave in the sample, (f) using higher or much lower photon energies than have been typical in the past, (g) taking advantage of space and/or time resolution, and (h) surrounding the sample with high ambient sample pressures of several torr.…”