2018
DOI: 10.1109/tvlsi.2018.2805470
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Experimental Investigation of 4-kb RRAM Arrays Programming Conditions Suitable for TCAM

Abstract: While Resistive RAM (RRAM) are seen as an alternative to NAND Flash, their variability and cycling understanding remain a major roadblock. Extensive characterizations of multi-kbits RRAM arrays during Forming, Set, Reset and cycling operations are presented allowing to investigate the relationships between programming conditions, memory window and endurance features. The experimental results are then used to perform variability-aware simulations of a RRAM-based ternary content-addressable-memory (TCAM) 128 bit… Show more

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Cited by 61 publications
(37 citation statements)
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“…Figure 1 presents the switching operations of a bipolar OxRAM. The electroforming step (in green) required by some RRAM technologies [24] [6] in order to create a first oxygen vacancies-based conductive filament is not considered here and assumed to be already performed. Then, the OxRAM can be switched from Low Resistance State (LRS) to High Resistance State (HRS) by reset operation (in red) or from HRS to LRS by a set operation (in blue).…”
Section: A Bipolar Resistive Switching Memoriesmentioning
confidence: 99%
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“…Figure 1 presents the switching operations of a bipolar OxRAM. The electroforming step (in green) required by some RRAM technologies [24] [6] in order to create a first oxygen vacancies-based conductive filament is not considered here and assumed to be already performed. Then, the OxRAM can be switched from Low Resistance State (LRS) to High Resistance State (HRS) by reset operation (in red) or from HRS to LRS by a set operation (in blue).…”
Section: A Bipolar Resistive Switching Memoriesmentioning
confidence: 99%
“…Compensating the VT loss by increasing the gate polarity (gate overdrive) leads to increased complexity, reliability issues and more complex voltage management. In [6] [7] [8] [9], the reset gate voltage is raised between 2.4 up to 6V in order to perform a fast reset. The high voltages considered will cause stress in (i) the selected bitcell transistor, (ii) the neighbors bitcells selectors sharing the same BL and WL and in (iii) the near memory array periphery.…”
Section: Polarity Gate (Pg)mentioning
confidence: 99%
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