Experimental evidence of strain relaxed domain structure in (100)/(001)-oriented epitaxial lead titanate thick films grown by metal organic chemical vapor deposition

Nakaki, Hiroshi; Kim, Yong Kwan; Yokoyama, S.; Ikariyama, Rikyu; Funakubo, Hiroshi; Streiffer, S. K.; Nishida, Ken; Saito, Keisuke; Gruverman, Alexei

doi:10.1063/1.2981193

Cited by 20 publications

(10 citation statements)

References 14 publications

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“…The lattice mismatch between the c-axis of PbTiO 3 and a-axis of SrTiO 3 is 0.063. The lattice parameters of this film are c = 0.4097 nm and a = 0.3900 nm [6,7]. The difference between the thin film and bulk crystals can be ascribed to the lattice and thermal mismatches as well as the domain configuration.…”

Section: Strain Mapping and Elastic Interaction 331 Geometric Phasementioning

confidence: 99%

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Configuration and local elastic interaction of ferroelectric domains and misfit dislocation in PbTiO₃/SrTiO₃epitaxial thin films

Kiguchi

Aoyagi

Ehara

et al. 2011

Science and Technology of Advanced Materials

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We have studied the strain field around the 90• domains and misfit dislocations in PbTiO 3 /SrTiO 3 (001) epitaxial thin films, at the nanoscale, using the geometric phase analysis (GPA) combined with high-resolution transmission electron microscopy (HRTEM) and high-angle annular dark field--scanning transmission electron microscopy (HAADF-STEM). The films typically contain a combination of a/c-mixed domains and misfit dislocations. The PbTiO 3 layer was composed from the two types of the a-domain (90• domain): a typical a/c-mixed domain configuration where a-domains are 20-30 nm wide and nano sized domains with a width of about 3 nm. In the latter case, the nano sized a-domain does not contact the film/substrate interface; it remains far from the interface and stems from the misfit dislocation. Strain maps obtained from the GPA of HRTEM images show the elastic interaction between the a-domain and the dislocations. The normal strain field and lattice rotation match each other between them. Strain maps reveal that the a-domain nucleation takes place at the misfit dislocation. The lattice rotation around the misfit dislocation triggers the nucleation of the a-domain; the normal strains around the misfit dislocation relax the residual strain in a-domain; then, the a-domain growth takes place, accompanying the introduction of the additional dislocation perpendicular to the misfit dislocation and the dissociation of the dislocations into two pairs of partial dislocations with an APB, which is the bottom boundary of the a-domain. The novel mechanism of the nucleation and growth of 90• domain in PbTiO 3 /SrTiO 3 epitaxial system has been proposed based on above the results.

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Section: Strain Mapping and Elastic Interaction 331 Geometric Phasementioning

confidence: 99%

“…• domain configuration depends strongly on the thickness of PbTiO 3 and PZT thin films [6][7][8]. Strain fields also affect the nucleation and growth of the 90…”

Section: Introductionmentioning

confidence: 99%

Configuration and local elastic interaction of ferroelectric domains and misfit dislocation in PbTiO₃/SrTiO₃epitaxial thin films

Kiguchi

Aoyagi

Ehara

et al. 2011

Science and Technology of Advanced Materials

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“…To enhance the piezoelectric property of the films, controlled concept of domain structure, such as so called "domain engineering" proposed for Pb(Mg 1/3 Nb 2/3 )O 3 -PbTiO 3 [4], must be take into account. We found the novel strain-relaxed domain structure, which was obtained in thick tetragonal PZT films [5][6][7][8][9]. We found the novel strain-relaxed domain structure, which was obtained in thick tetragonal PZT films [5][6][7][8][9].…”

Section: Introductionmentioning

confidence: 99%

Determination Factors of Strain-relaxed Complex Domain Structure observed in Thick Epitaxial pb(Zr,Ti)O₃Films

et al. 2009

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Crystal structure change with the temperature was investigated for 3 m-thick (100)/(001)-oriented epitaxial PbTiO 3 films grown on SrTiO 3 substrates. Complex strain-relaxed domain structure labeled as Type III was observed and directly transformed to the cubic phase at about 490 o C. This transition temperature and the lattice parameter (a and c-axes) change with the temperature well agreed with the reported data for the PbTiO 3 powders. The volume fraction of the (001) orientations, Vc, was almost independent of the temperature up to the phase transition temperature. The tilting angles of the spots in XRD plan view were almost the same with the estimated ones from the lattice parameters and the Vc. This suggests that the angle of the domains identified by the domain structure in Type III. This structure is mainly determined by the tetragonality, (c/a ratio) and the Vc.

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“…The domain structure of PTO films has been studied by x-ray diffraction (XRD) analysis, transmission electron microscopy (TEM) and piezoresponse force microscopy (PFM) [7][8][9][10][11]. The domain structure of PTO films depends on the film thickness and the type of fabrication method.…”

Section: Introductionmentioning

confidence: 99%

“…In films thicker than 1100 nm, c-domains tilt along the fourfold degenerate [110], [110], [110], and [110] STO axes [9][10][11]. The domain structure model of such thick films has been proposed on the basis of XRD and PFM results [9][10][11].…”

Section: Introductionmentioning

confidence: 99%

Diffraction contrast analysis of 90° and 180° ferroelectric domain structures of PbTiO₃thin films

Aoyagi¹,

Kiguchi²,

Yamada³

et al. 2011

Science and Technology of Advanced Materials

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The ferroelectric domain structure of a PbTiO 3 thin film on (100) SrTiO 3 has been investigated by transmission electron microscopy (TEM). Two types of a-domain were found: one extended through the film to the surface and another comprised small a-domains confined within the film. Dark-field TEM (DFTEM) observation revealed that 180• domains formed near the substrate and stopped their growth 100 nm away from the substrate. The DFTEM observation also revealed that 90• domain boundaries had head-to-tail structures. To confirm the polarization direction obtained by experiments, diffracted intensities under a two-beam condition were simulated using the extended Darwin-Howie-Whelan equations. On the basis of the obtained results, a ferroelectric domain structure model of PbTiO 3 thin films on SrTiO 3 is proposed.

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Experimental evidence of strain relaxed domain structure in (100)/(001)-oriented epitaxial lead titanate thick films grown by metal organic chemical vapor deposition

Cited by 20 publications

References 14 publications

Configuration and local elastic interaction of ferroelectric domains and misfit dislocation in PbTiO₃/SrTiO₃epitaxial thin films

Configuration and local elastic interaction of ferroelectric domains and misfit dislocation in PbTiO₃/SrTiO₃epitaxial thin films

Determination Factors of Strain-relaxed Complex Domain Structure observed in Thick Epitaxial pb(Zr,Ti)O₃Films

Diffraction contrast analysis of 90° and 180° ferroelectric domain structures of PbTiO₃thin films

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Experimental evidence of strain relaxed domain structure in (100)/(001)-oriented epitaxial lead titanate thick films grown by metal organic chemical vapor deposition

Cited by 20 publications

References 14 publications

Configuration and local elastic interaction of ferroelectric domains and misfit dislocation in PbTiO3/SrTiO3epitaxial thin films

Configuration and local elastic interaction of ferroelectric domains and misfit dislocation in PbTiO3/SrTiO3epitaxial thin films

Determination Factors of Strain-relaxed Complex Domain Structure observed in Thick Epitaxial pb(Zr,Ti)O3Films

Diffraction contrast analysis of 90° and 180° ferroelectric domain structures of PbTiO3thin films

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Configuration and local elastic interaction of ferroelectric domains and misfit dislocation in PbTiO₃/SrTiO₃epitaxial thin films

Configuration and local elastic interaction of ferroelectric domains and misfit dislocation in PbTiO₃/SrTiO₃epitaxial thin films

Determination Factors of Strain-relaxed Complex Domain Structure observed in Thick Epitaxial pb(Zr,Ti)O₃Films

Diffraction contrast analysis of 90° and 180° ferroelectric domain structures of PbTiO₃thin films