Experimental determinations of the quantity M/ρ for silicon single crystals used in the determination of the Avogadro constant

Bièvre, Paul De; Valkiers, S.; Peiser, S.; Spieweck, F.; Bettin, H.; Peuto, A.; Sacconi, A.; Mosca, Mauro; Fujii, K.; Tanaka, Mitsuru; Nezu, Y.

doi:10.1109/cpem.1994.333368

Search citation statements

Order By: Relevance

Paper Sections

Select...

Systematic Errors In Volume Measurement1

Citation Types

Supporting

Mentioning

Contrasting

Publication Types

Select...

Article2

Other1

Relationship

Self Cite0

Independent3

Authors

Journals

Cited by 3 publications

(1 citation statement)

References 2 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…the head of the icosahedron, is oriented approximately to (loo), (OlO), (OOl), (lll), (1-11), (-111) or (-1-11). Direct averaging over seventy breadths gives a standard deviation of 66, 49 nm, which implies a mean standard deviation of 7,95 nm, and 2,5 x…”

Section: Systematic Errors In Volume Measurementmentioning

confidence: 99%

Density of Silicon Crystals

Tanaka¹,

Peuto

1994

Metrologia

View full text Add to dashboard Cite

Measurements of silicon crystal density for the determination of the Avogadro constant are reviewed. Volume, mass and hydrostatic-weighing measurements are considered from the technical standpoints of error sources and uncertainty of measurement. The outlook on the possibility of achieving experimental uncertainties of less than 10-7 is described. Attention is paid to the necessity of reducing the sources of uncertainty in the density arising from the surface, such as silica layers and damaged crystalline layers.

show abstract

Section: Systematic Errors In Volume Measurementmentioning

confidence: 99%