Experimental determination of the x-ray atomic fundamental parameters of nickel

Ménesguen, Y.; Lépy, Marie‐Christine; Hönicke, Philipp; Müller, Mat­thias; Unterumsberger, Rainer; Beckhoff, Burkhard; Hoszowska, J.; Dousse, J.-Cl.; Błachucki, Wojciech; Ito, Yoshiaki; Yamashita, Michiru; Fukushima, Sei

doi:10.1088/1681-7575/aa9b12

Cited by 33 publications

(21 citation statements)

References 46 publications

(120 reference statements)

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“…They are calculated by error propagation of the basic uncertainties of all measurements and of the data analysis procedures such as the fitting of the high-resolution spectra. A detailed description of the uncertainty assessment can be found in [55] and [50,52] for the FY of the K-shell and the L-shell parameters, respectively. The achieved relative uncertainty of the K FY is 3.4% only.…”

Section: Resultsmentioning

confidence: 99%

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Theoretical and experimental determination of K - and L -shell x-ray relaxation parameters in Ni

et al. 2018

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Fluorescence yields (FY) for the Ni K and L shells were determined by a theoretical and an experimental group within the framework of the International Initiative on X-ray Fundamental Parameters (FPs) collaboration. CosterKronig (CK) parameters were also measured for the L shell of Ni. Theoretical calculations of the same parameters were performed using the Dirac-Fock method, including relativistic and QED corrections. The experimental values for the FY and CK were determined at the PTB laboratory in the synchrotron radiation facility BESSY II, Berlin, Germany, and are compared to the corresponding calculated values.

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Section: Resultsmentioning

confidence: 99%

“…The main contributors to the stated uncertainty budget are the attenuation correction factor and the determination of the photoelectric cross section. Further details can be found in [55].…”

Section: B Nickel K -Shell Fluorescence Yieldmentioning

confidence: 99%

Theoretical and experimental determination of K - and L -shell x-ray relaxation parameters in Ni

et al. 2018

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“…New values are obtained with a relative combined standard uncertainty below 2%. We discussed in previous papers the determination of the mass attenuation coefficients for copper and zinc, nickel, germanium, tin, and bismuth . As an example, values for silver are presented as they appear on the website for users on Figure .…”

Section: Comparison Of Mass Attenuation Measurements With Epdl97mentioning

confidence: 99%

“…This methodology takes advantage of the accurate and independent measurement of the average mass per area of thin foil samples as well as the large X‐ray spot available at the synchrotron source. Several results were already published in the field for various elements. For every element, the K , L , and M absorption edges were studied more carefully with adapted energy steps in order to describe the absorption fine structures if any.…”

Section: Introductionmentioning

confidence: 99%

Advances in the measurements of the mass attenuation coefficients

2018

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The knowledge of atomic fundamental parameters, such as mass attenuation coefficients or fluorescence yields with low uncertainties, is of decisive importance in elemental quantification involving X‐ray fluorescence analysis techniques. Several databases providing the mass attenuation coefficients are accessible and frequently used within a large community of users. These compilations are most often in good agreement for photon energies in the hard X‐ray ranges. However, they significantly differ for low photon energies and around the absorption edges of the elements. Mass attenuation coefficients of several elements were determined experimentally in the photon energy range from 100 eV to 35 keV by using monochromatized radiation at the SOLEIL synchrotron (France). The application of high‐accuracy experimental techniques resulted in low uncertainty mass attenuation coefficients. The results are compared with tabulated data.

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“…The atomic fundamental parameters, e.g. the fluorescence yields, the Coster-Kronig factors or the photoionization cross sections have been experimentally determined using the monoelemental coatings [16,17,18,29] or were taken from databases [30,31,32]. The results of the reference-free quantification are shown in Table 2.…”

Section: Xrf Calibration Samplesmentioning

confidence: 99%

Development and characterization of sub-monolayer coatings as novel calibration samples for X-ray spectroscopy

Hönicke

Krämer

Lühl

et al. 2018

Spectrochimica Acta Part B: Atomic Spectroscopy

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With the advent of both modern X-ray fluorescence (XRF) methods and improved analytical reliability requirements the demand for suitable reference samples has increased. Especially in nanotechnology with the very low areal mass depositions, quantification becomes considerably more difficult. However, the availability of suited reference samples is drastically lower than the demand. Physical vapor deposition (PVD) techniques have been enhanced significantly in the last decade driven by the need for extremely precise film parameters in multilayer production. We have applied those techniques for the development of layer-like reference samples with mass depositions in the ng-range and well below. Several types of reference samples were fabricated: multi-elemental layer and extremely low (sub-monolayer) samples for various applications in XRF and total-reflection XRF (TXRF) analysis. Those samples were characterized and compared at three different synchrotron radiation beamlines at the BESSY II electron storage ring employing the reference-free XRF approach based on physically calibrated instrumentation. In addition, the homogeneity of the multi-elemental coatings was checked at the P04 beamline at DESY. The measurements demonstrate the high precision achieved in the manufacturing process as well as the versatility of application fields for the presented reference samples.

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Experimental determination of the x-ray atomic fundamental parameters of nickel

Cited by 33 publications

References 46 publications

Theoretical and experimental determination of K - and L -shell x-ray relaxation parameters in Ni

Theoretical and experimental determination of K - and L -shell x-ray relaxation parameters in Ni

Advances in the measurements of the mass attenuation coefficients

Development and characterization of sub-monolayer coatings as novel calibration samples for X-ray spectroscopy

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