2016
DOI: 10.1016/j.sab.2016.08.024
|View full text |Cite
|
Sign up to set email alerts
|

Experimental determination of the oxygen K-shell fluorescence yield using thin SiO 2 and Al 2 O 3 foils

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

1
27
0

Year Published

2017
2017
2023
2023

Publication Types

Select...
8

Relationship

2
6

Authors

Journals

citations
Cited by 31 publications
(28 citation statements)
references
References 19 publications
1
27
0
Order By: Relevance
“…Each spectrum is then deconvoluted using the detector response functions for the fluorescence lines of interest and relevant background contributions . Using tabulated and experimentally determined, fundamental parameter data, the mass deposition of the respective material can be quantified from the deconvoluted fluorescence intensities …”
Section: Resultsmentioning
confidence: 99%
“…Each spectrum is then deconvoluted using the detector response functions for the fluorescence lines of interest and relevant background contributions . Using tabulated and experimentally determined, fundamental parameter data, the mass deposition of the respective material can be quantified from the deconvoluted fluorescence intensities …”
Section: Resultsmentioning
confidence: 99%
“…A free-standing 500 nm Ni foil was used for these experiments at the FCM beamline of PTB [42]. The applied experimental procedures follow our earlier works on the experimental determination of the O-K [53] and the Ti-K shell [49] fluorescence yields as well as the previously described determination of the L-shell fluorescence yields. From the measured transmission of the foil, experimental values for the self-attenuation of the foil as well as the PECS can be derived.…”
Section: B Nickel K -Shell Fluorescence Yieldmentioning
confidence: 99%
“…The Physikalisch-Technische Bundesanstalt (PTB), Germany's national metrology institute, determines atomic fundamental parameters by means of the reference-free XRF approach [2][3][4][5] . In X-ray spectrometry the term fundamental parameters (FP) generally refers to element specific parameters relevant to the production of XRF radiation such as fluorescence yields, line widths and energies, relative transition probabilities and, in the case of L-shells and higher shells, Coster-Kronig transition probabilities.…”
Section: Introductionmentioning
confidence: 99%