ASME 2011 Pacific Rim Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Systems, MEMS 2011
DOI: 10.1115/ipack2011-52209
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Experimental Characterization and Viscoplastic Modeling of the Temperature Dependent Material Behavior of Underfill Encapsulants

Abstract: In this work, the viscoplastic mechanical response of a typical underfill encapsulant has been characterized via rate dependent stress-strain testing over a wide temperature range, and creep testing for a large range of applied stress levels and temperatures. A specimen preparation procedure has been developed to manufacture 80 × 5 mm uniaxial tension test samples with a specified thickness of .5 mm. The test specimens are dispensed and cured with production equipment using the same conditions as those used in… Show more

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Cited by 16 publications
(5 citation statements)
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“…The glass transition region for T > +100 C is clearly evident. In our prior work [24][25]32], we have found that an empirical four-parameter hyperbolic tangent model can be used to accurately model the observed nonlinear stress-strain data at any temperature. The general representation of this relation is…”
Section: Experimental Data For Underfillmentioning
confidence: 98%
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“…The glass transition region for T > +100 C is clearly evident. In our prior work [24][25]32], we have found that an empirical four-parameter hyperbolic tangent model can be used to accurately model the observed nonlinear stress-strain data at any temperature. The general representation of this relation is…”
Section: Experimental Data For Underfillmentioning
confidence: 98%
“…After the Prony coefficients were determined, the master curve at a reference temperature was shifted to the various temperatures for comparison with experimental data. Chhanda, et al [24][25] have also used a Prony series viscoelastic model to represent the time dependent mechanical behavior of underfill encapsulants. They showed the model could accurately represent creep and stress-strain for a variety of temperatures.…”
Section: Figure 1 -Flip Chip Cbga Assemblymentioning
confidence: 99%
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“…In our work, the thermal drifts were kept smaller than 0.05 nm/sec, and the thermal drift effects were excluded from the resulting displacement data. The method for calculating the creep strain rate proposed by Mayo and Nix [38] has been adopted in this study, as well as log hyperbolic tangent creep model proposed by Chhanda, et al [39]. In addition, the approach presented by the authors in reference [20] has been utilized to predict (extrapolate) tensile creep strain rates for low stress levels using nanoindentation creep data measured at very high compressive stress levels.…”
Section: Figure 2 -Solder Ball After Nanoindentation Testing At Variomentioning
confidence: 99%