Experimental and Theoretical Study on failure mechanism of Superjunction MOSFET under H3TRB Testing

Zhou, Tong; Ren, Min; Ren, Min; Zhang, Xin; Liang, Siqi; Zhou, Jianyu; Zheng, Fang; Ma, Rongyao; Pi, Meng; Li, Zehong; Guo, Xinkai; Zhang, Bo

doi:10.1109/ispsd59661.2024.10579610

2024 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD) 2024

DOI: 10.1109/ispsd59661.2024.10579610

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Experimental and Theoretical Study on failure mechanism of Superjunction MOSFET under H3TRB Testing

Tong Zhou,

Min Ren,

Min Ren

et al.

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Experimental and Theoretical Study on failure mechanism of Superjunction MOSFET under H3TRB Testing

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