Experimental and simulated investigation of −100 V rated P-channel UMOSFETs under heavy ion radiation

Wu, Xiao-dong; Yu, Cheng-hao; Liu, Yan; Hu, Hai-fan

doi:10.1016/j.microrel.2023.115250

Microelectronics Reliability

2023

DOI: 10.1016/j.microrel.2023.115250

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Experimental and simulated investigation of −100 V rated P-channel UMOSFETs under heavy ion radiation

Xiao-dong Wu,

Cheng-hao Yu,

Yan Liu

et al.

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Experimental and simulated investigation of −100 V rated P-channel UMOSFETs under heavy ion radiation

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References 16 publications

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