Exotic three-phase microstructures in the ternary Ag-Cu-Sb eutectic system

Aramanda, Shanmukha Kiran; Chattopadhyay, K.; Choudhury, Abhik

doi:10.1016/j.actamat.2021.117400

Cited by 15 publications

(2 citation statements)

References 84 publications

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“…Another crystal growth mechanism that also produces hollow spaces 50 is not in play here, due to the long and thin morphology of rhombohedral KBiS 2 crystals with an unvarying radius of the needle-shaped crystals and the hollow core inside. Thus, we believe the needles grew from screw dislocation.…”

Section: ■ Results and Discussionmentioning

confidence: 99%

Morphology and Growth Habit of the New Flux-Grown Layered Semiconductor KBiS₂ Revealed by Diffraction Contrast Tomography

Bale

Riedel

et al. 2022

Crystal Growth & Design

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Single crystals of rhombohedral KBiS 2 were synthesized for the first time, and the structure, growth habit, and properties of this layered semiconductor are presented. The single crystals form from a reactive K 2 S 5 salt flux and are still embedded in the residual flux, without removal from the reaction vessel throughout the whole study. Laboratory diffraction contrast tomography (LabDCT) was used to identify the crystalline phase, orientation, and microstructure of the crystals. Meanwhile, powder and single-crystal X-ray diffraction were used to determine detailed crystallographic information. The morphology of the crystalline assemblies observed by absorption contrast tomography reveals screw-dislocation-driven growth to be the dominant mechanism. First-principles electronic structure simulations predict rhombohedral KBiS 2 to be a semiconductor with an indirect band gap, which was confirmed by experiment. This study demonstrates how nondestructive tomographic imaging and 3D crystallography methods can lead to advances in discovering new materials and studying crystal growth mechanisms.

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Section: ■ Results and Discussionmentioning

confidence: 99%

Morphology and Growth Habit of the New Flux-Grown Layered Semiconductor KBiS₂ Revealed by Diffraction Contrast Tomography

Bale

Riedel

et al. 2022

Crystal Growth & Design

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“…The 3D structure of eutectic cells has been debated since the 1960s [3,24,25] and continues to present day [26,27,28]. A confounding issue is that investigators lacked suitable (i.e., 3D space-and time-resolved) measurements on the growth dynamics of eutectic colonies, as will be elaborated on below.…”

Section: Introductionmentioning

confidence: 99%

Pseudo-4D view of the growth and form of locked eutectic colonies

Chao,

Lindemann,

Shahani

2022

Preprint

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We investigate solidification of an Al-Al 2 Cu as a model system to understand the emergence of patterns (such as lamellar, rod and maze-like) within eutectic colonies. To uncover the morphological transitions in-situ and in 3D, we introduce here a new synchrotron-based, X-ray imaging procedure. Our method simultaneously maximizes the temporal (200 ms) and spatial resolution (0.69 2 µm 2 /pixel) over that of traditional imaging approaches. The wealth of information obtained from this procedure enables us to visualize the development of a crystallographically 'locked' eutectic microstructure in the presence of thermosolutal convection. This data provides direct insight into the mechanism of the lamella-to-rod transition as the eutectic accommodates fluctuations in interfacial composition and growth velocity. We find that this transition is brought about by impurity-driven forces acting on the solid-solid-liquid trijunction that must overcome the stiffness of the solid-solid interfaces.Our pseudo-4D imaging strategy holds broad appeal to the solidification science community, as it can overcome the space-time trade-off in conventional in situ X-ray microtomography.

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Unveiling the Intricacies of a Ductile‐Phase Toughened Intermetallic: An In‐Depth Exploration of a Eutectic Mo–Si–Ti Alloy and its Mechanical Behavior

Vikram,

Aramanda,

Schliephake

et al. 2024

Adv Eng Mater

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In this work, we present the development of directional solidification for a novel high‐temperature Mo‐20Si‐52.8Ti (at. %) ternary alloy using a modified Bridgeman type apparatus. The resulting alloy exhibits a microstructure consisting of a body‐centered cubic solid solution BCCss and a hexagonal silicide (Ti,Mo)5Si3 with approximate volume fractions of 50% for each phase. The phases exhibit a crystallographic orientation relationship with and . Different solidification velocities were imposed which revealed an inverse relationship to the lamellar spacing according to a Jackson‐Hunt type scaling. Mechanical characterization using Vickers indentation demonstrated that the BCCss accommodates plasticity through dislocation mediation, while the silicide phase exhibits high hardness and brittleness, serving as a crack initiation site. Crack propagation was arrested and deflected at the interface to the BCCss. Fracture toughness measurements via indentation yield a fracture toughness of 3.7 MPa√m for the silicide, somewhat higher than previously reported values for Si‐ and Cr‐based intermetallics. The directionally solidified (DS) specimens showed an enhanced fracture toughness attributed to a greater BCCss length scale; thus, combining the ductile and hard phases resulted in a ductile‐phase toughened intermetallic composite. The findings open up new possibilities for the design of advanced intermetallic composites with improved toughness performance.This article is protected by copyright. All rights reserved.

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Exotic three-phase microstructures in the ternary Ag-Cu-Sb eutectic system

Cited by 15 publications

References 84 publications

Morphology and Growth Habit of the New Flux-Grown Layered Semiconductor KBiS₂ Revealed by Diffraction Contrast Tomography

Morphology and Growth Habit of the New Flux-Grown Layered Semiconductor KBiS₂ Revealed by Diffraction Contrast Tomography

Pseudo-4D view of the growth and form of locked eutectic colonies

Unveiling the Intricacies of a Ductile‐Phase Toughened Intermetallic: An In‐Depth Exploration of a Eutectic Mo–Si–Ti Alloy and its Mechanical Behavior

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Exotic three-phase microstructures in the ternary Ag-Cu-Sb eutectic system

Cited by 15 publications

References 84 publications

Morphology and Growth Habit of the New Flux-Grown Layered Semiconductor KBiS2 Revealed by Diffraction Contrast Tomography

Morphology and Growth Habit of the New Flux-Grown Layered Semiconductor KBiS2 Revealed by Diffraction Contrast Tomography

Pseudo-4D view of the growth and form of locked eutectic colonies

Unveiling the Intricacies of a Ductile‐Phase Toughened Intermetallic: An In‐Depth Exploration of a Eutectic Mo–Si–Ti Alloy and its Mechanical Behavior

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Product

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Morphology and Growth Habit of the New Flux-Grown Layered Semiconductor KBiS₂ Revealed by Diffraction Contrast Tomography

Morphology and Growth Habit of the New Flux-Grown Layered Semiconductor KBiS₂ Revealed by Diffraction Contrast Tomography