2013
DOI: 10.1038/nnano.2013.94
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Exchange bias of the interface spin system at the Fe/MgO interface

Abstract: The ferromagnet/oxide interface is key to developing emerging multiferroic and spintronic technologies with new functionality. Here we probe the Fe/MgO interface magnetization, and identify a new exchange bias phenomenon manifested only in the interface spin system, and not in the bulk. The interface magnetization exhibits a pronounced exchange bias, and the hysteresis loop is shifted entirely to one side of the zero field axis. However, the bulk magnetization does not, in marked contrast to typical systems wh… Show more

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Cited by 102 publications
(87 citation statements)
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“…The loss of spin filtering would be related to the Verwey transition (expected at T V ∼ 120 K) in which Fe 3 O 4 goes from insulator below T V to semiconductor. This FeO X layer has been reported to form at the interface between Fe and MgO, even in high-vacuum conditions, due to Fe-O bonding [24]. Although in Fe/MgO/Fe systems the FeO X layer is suppressed by appropriate annealing treatments, in our case an enhancement of the FeO X layer after annealing is detected, thus suggesting that the LSMO layer may well act as an extra source of oxygen for the oxidation of the Fe interface.…”
Section: Discussioncontrasting
confidence: 40%
See 1 more Smart Citation
“…The loss of spin filtering would be related to the Verwey transition (expected at T V ∼ 120 K) in which Fe 3 O 4 goes from insulator below T V to semiconductor. This FeO X layer has been reported to form at the interface between Fe and MgO, even in high-vacuum conditions, due to Fe-O bonding [24]. Although in Fe/MgO/Fe systems the FeO X layer is suppressed by appropriate annealing treatments, in our case an enhancement of the FeO X layer after annealing is detected, thus suggesting that the LSMO layer may well act as an extra source of oxygen for the oxidation of the Fe interface.…”
Section: Discussioncontrasting
confidence: 40%
“…The existence of FeO X at the interface has been reported in several cases, showing that its amount depends critically on the MgO growth method. FeO X has been shown to form at the interface between Fe and MgO due to Fe-O bonding [24]. The detrimental effect of this FeO X layer on the TMR response, and its improvement after different thermal annealing treatments, has also been previously reported [25].…”
Section: Resultsmentioning
confidence: 80%
“…On the contrary, for a semiconducting or insulating spacer [3][4][5][6][7][8], magnetic properties seem to depend deeply on growth conditions and then on structural specifications. Among them, the MgO spacer [9][10][11][12][13][14][15][16][17][18][19][20][21][22][23][24] appears unique in presenting a large variety of experimental results. They concern either the MgO thickness range and the coupling sign and strength, or the junction magnetic geometry (planar or perpendicular magnetization).…”
Section: Introductionmentioning
confidence: 99%
“…But these are usually associated with interface between FM/AFM or FM/ferrimagnetic materials, which is not the case here. However, one recent work [29] is worth mentioning here. An H EB of $19 Oe is reported for a Fe/MgO sample.…”
Section: Introductionmentioning
confidence: 99%