1995
DOI: 10.1063/1.359422
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Excess noise, structural properties, and their effects on bolometric performance of thin superconducting films on silicon membranes

Abstract: Effects of substrate temperature on structural properties of undoped silicon thin films

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Cited by 7 publications
(1 citation statement)
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“…No further attempts have been made in this work to theoretically determine the noise equivalent power (NEP) or detectivity . The noise behavior of these devices is largely related to the structural quality of the superconducting films [7], [8] and, thus, is very difficult to model quantitatively.…”
Section: Device Performance and Comparison With Experimental Datamentioning
confidence: 99%
“…No further attempts have been made in this work to theoretically determine the noise equivalent power (NEP) or detectivity . The noise behavior of these devices is largely related to the structural quality of the superconducting films [7], [8] and, thus, is very difficult to model quantitatively.…”
Section: Device Performance and Comparison With Experimental Datamentioning
confidence: 99%