1995
DOI: 10.1016/1381-1169(95)00131-x
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Examination of vanadium contaminated pillared rectorite catalysts with the atomic force microscope

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Cited by 6 publications
(2 citation statements)
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“…An example of the impact of new instrumental techniques is provided by atomic force microscopy (AFM), a powerful technique that can generate the images of surfaces with atomic resolution. AFM has been used successfully to investigate the surface features of pillared rectorite catalysts [6,7,8]. Several studies were also conducted to observe the FCC catalyst surfaces using AFM [9,10].…”
Section: Introductionmentioning
confidence: 99%
“…An example of the impact of new instrumental techniques is provided by atomic force microscopy (AFM), a powerful technique that can generate the images of surfaces with atomic resolution. AFM has been used successfully to investigate the surface features of pillared rectorite catalysts [6,7,8]. Several studies were also conducted to observe the FCC catalyst surfaces using AFM [9,10].…”
Section: Introductionmentioning
confidence: 99%
“…They reported that the obtained interlayer distance was coincident with that from XRD measurement. Occelli et al used an atomic force microscope (AFM) to investigate the surface features of a pillared montmorillonite, and they provided atomicscale details of the basal planes of clays and pillared clays (11). Although studies of the pillar structure and the pore structure in the interlayers of a pillared clay were few, Ooka et al investigated the pore structure of pillared clays by analyzing the relation between the amount of dye molecule adsorbed and the amount of pillar intercalated (12,13).…”
Section: Introductionmentioning
confidence: 99%