Exact computation of two-port noise parameters

Vasilescu, G.; Alquié, G.; Krim, M.

doi:10.1049/el:19890203

Cited by 32 publications

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“…Vasilescu et al proposed a procedure to directly solve the four noise parameters from four nonlinear equations in the format of (2) [36]. With four measured noise factors and their corresponding source admittances, based on (2), we have four non-linear equations given by 2 …”

Section: Vasilescu Et Al's Methodsmentioning

confidence: 99%

Accuracy Issues of on-Wafer Microwave Noise Measurements

Chen

2008

Fluct. Noise Lett.

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Communicated by François DannevilleThe accuracy issues of on-wafer noise characterization for a linear noisy two-port are presented in this paper. It starts with the description of a microwave noise measurement system and the possible source of error due to the microwave power meter in the measurement system. With the description of noise characterization techniques, this paper reviews a couple of methods for noise parameter extraction to handle the errors in the measured noise powers, noise factors, and source admittances. It also presents the methods to extract the physical noise parameters and to take care of different source admittances in the hot and cold states for accuracy enhancement.

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Section: Vasilescu Et Al's Methodsmentioning

confidence: 99%

Accuracy Issues of on-Wafer Microwave Noise Measurements

Chen

2008

Fluct. Noise Lett.

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“…Lane introduced an effective noise parameter extraction method in which the nonlinear equation of the noise factor (NF), as a function of the four classical noise parameters, was linearized by swapping parameters 6 . After that, several computational methods have been proposed to ameliorate the accuracy of the extracted noise parameters 5,7‐10 . To reduce the error of the extracted noise parameters caused by measurement uncertainties, a redundant data set from a larger number of source impedances was used, increasing the measurement time 8,11,12 .…”

Section: Introductionmentioning

confidence: 99%

On optimum impedance pattern for accurate wideband noise parameter characterization

Rahmati

Banai

2021

Int J RF Microw Comput Aided Eng

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At least four source impedances are required to characterize the noise parameters of a two‐port network. The accuracy of the noise parameters depends on the configuration of the employed source impedances (pattern). The configuration of a specified pattern, generated generally by an impedance tuner, changes with frequency, and as such, the accuracy is usually degraded in a wideband characterization. To realize a low‐error wideband noise characterization, the present article thoroughly investigates the method of choosing a four‐source impedance pattern. A Monte Carlo simulation‐based approach is proposed to obtain the desired impedance patterns. The measurement and simulation results show that the noise parameters are accurately extracted when an impedance pattern is configured by a source impedance located near the center of the Smith chart and three other impedances located as close to the edge as possible with interphase separations of at least 45°. While the interphase separations remain unchanged, the impedance pattern rotation around the center of the Smith chart does not affect the accuracy of the extracted noise parameters, as demonstrated analytically here. The resultant impedance pattern realizes a wideband characterization from f0 to 3.5f0 without using an impedance tuner. The obtained accuracy is comparable to methods employing a redundant number of source impedances.

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“…The intuitive, impedance-based representation of the noisy two-port network also demonstrates the dependence of noise factors on the source admittances attached to the input of the network. Since the introduction of this two-port noise representation, many measurement and extraction methods have been introduced (Lane, 1969;Mitama & Katoh, 1979;Vasilescu, Alquie & Krim, 1988;O'Callaghan & Mondal, 1991). Fig.…”

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confidence: 99%

“…In the first approach, four (or more) noise factors are obtained first using the Y-factor method (Agilent Application Note 57-1). The four noise parameters are then calculated by solving the linearized noise factor equations with algorithms or methods to take care of the experimental errors in the noise factors and the source admittances (IRE Subcommittee 7.9 on Noise, 1963;Lange, 1967;Lane, 1969;Gupta, 1970;Caruso & Sannino, 1978;Mitama & Katoh, 1979;Sannino, 1979;Pospieszalski, 1986;Vasilescu, Alquie & Krim, 1988;Davidson et al, 1989;O'Callaghan & Mondal, 1991;Archer & Batchelor, 1992;Boudiaf & Laporte, 1993;Tiemeijer et al, 2005;Wiatr & Walker, 2005). The second approach, on the other hand, directly solves the noise parameters using the power equation (Adamian & Uhlir, 1973;Tutt, 1994).…”

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confidence: 99%

Thermal Noise in Modern CMOS Technology

Chen¹

2010

Solid State Circuits Technologies

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Exact computation of two-port noise parameters

Cited by 32 publications

References 0 publications

Accuracy Issues of on-Wafer Microwave Noise Measurements

Accuracy Issues of on-Wafer Microwave Noise Measurements

On optimum impedance pattern for accurate wideband noise parameter characterization

Thermal Noise in Modern CMOS Technology

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