1999
DOI: 10.1063/1.124992
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Evolutionary phase diagrams for plasma-enhanced chemical vapor deposition of silicon thin films from hydrogen-diluted silane

Abstract: Features of hydrogenated amorphous silicon films developed under an unexplored region of parameter space of radio-frequency plasma-enhanced chemical vapor deposition Plasma-enhanced chemical vapor deposition of intrinsic microcrystalline silicon from chlorine-containing source gas J. Vac. Sci. Technol. A 16, 3218 (1998); 10.1116/1.581525 Dominant monohydride bonding in hydrogenated amorphous silicon thin films formed by plasma enhanced chemical vapor deposition at room temperature

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Cited by 149 publications
(104 citation statements)
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References 16 publications
(25 reference statements)
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“…Differently from SiH 4 -H 2 plasmas where H 2 %>90% is used to deposit microcrystalline films [15,17,[22][23][24][25][26], the a-Si to µc-Si transition in SiF 4 -based plasmas does not require a high H 2 dilution, as demonstrated by various papers. As an example, Shimizu and his group have reported [75] almost complete (400)-oriented µc-Si:H,F growth at gas flow ratios of SiF 4 /H 2 = 60/3 sccm at 300°C and 30 /14 sccm at 200°C, while at smaller SiF 4 /H 2 gas flow ratios such as 30/10 sccm, (220)-oriented µc-Si:H,F films were obtained using very high frequency (VHF: 100MHz).…”
Section: Amorphous To Microcrystalline Silicon Transitionmentioning
confidence: 99%
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“…Differently from SiH 4 -H 2 plasmas where H 2 %>90% is used to deposit microcrystalline films [15,17,[22][23][24][25][26], the a-Si to µc-Si transition in SiF 4 -based plasmas does not require a high H 2 dilution, as demonstrated by various papers. As an example, Shimizu and his group have reported [75] almost complete (400)-oriented µc-Si:H,F growth at gas flow ratios of SiF 4 /H 2 = 60/3 sccm at 300°C and 30 /14 sccm at 200°C, while at smaller SiF 4 /H 2 gas flow ratios such as 30/10 sccm, (220)-oriented µc-Si:H,F films were obtained using very high frequency (VHF: 100MHz).…”
Section: Amorphous To Microcrystalline Silicon Transitionmentioning
confidence: 99%
“…However, all the above cited works deposited microcrystalline silicon at T>230°C. Nevertheless, H 2 , i.e., the hydrogen-dilution ratio R (H 2 /SiH 4 ), has been reported by other groups to be important for aiding the amorphous-to-microcrystalline silicon phase transitions [15,17,[22][23][24][25][26], defects [62,63] and electronic properties [64][65][66][67][68].…”
Section: Relationship Occurring Between the Halogenated (Fluorine) Plmentioning
confidence: 99%
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“…Also, the increase in the parameter C indicates a reduced order in the film. 10 Accordingly, we can be speculate that an ultrathin contaminant layer is formed at the surface after UV irradiation due to the adsorption of residual species. On the contrary, 1 and 2 spectra all shift to lower energy and increase in peak amplitude after the UTA.…”
mentioning
confidence: 99%