Evolution structurale de films minces de bismuth entre 8 K et 573 K: Influence de la surfusion

Structural study of bismuth films and its consequences on their electrical properties

“…, These results are in agreement with those reported by numerous authors [2][3][4][5][6][7][8][9][10][11]. Indeed, it has appeared that the (0001) planes tend to lie parallely to the substrate whenever the films are evaporated on an amorphous substrate of carbon, collodion or glass and also when they are epitaxially grown on both, mica and sodium chloride.…”

“…As in [31], the following values have been chosen : k = 3, ô = 3 x 10-' and EF = 0.23 eV. The most sensitive parameters in (5) are a and ç that have been chosen to be ~2 = 1 eV and a = 7 A to provide the most convenient fit to experimental values of U2 in [1]. For the value of 03C31 to be obtained with [5] it will be assumed, in agreement with the structural analysis, that all the preceding parameters remain unchanged excepted (p which takes on a larger value (çi > ~2), as a result of the larger density of surface states in process n° 1 (Fig.…”