Evolution of Thermal Microcracking in Refractory ZrO2-SiO2 after Application of External Loads at High Temperatures

Laquai, René; Gouraud, Fanny; Müller, Bernd R.; Huger, Marc; Chotard, Thierry; Antou, Guy; Bruno, Giovanni

doi:10.3390/ma12071017

Cited by 13 publications

(7 citation statements)

References 28 publications

(34 reference statements)

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“…Beyond the two examples, SXRR has been shown to be a suitable tool to quantify the evolution of thermal microcracking in zirconia-based refractories [14] and for the in situ observation of evolving stress cracks in carbon fiber reinforced plastics [15]. In general, SXRR and SXRCT are excellently suited to observe (even early stage) damages in lightweight materials and to classify the type of defects by quantifying the specific surface.…”

Section: Discussionmentioning

confidence: 99%

The combined use of X-ray refraction and transmission radiography and computed tomography

Bruno¹,

Laquai²,

Wieder³

et al. 2022

eJNDT

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Alternative to conventional transmission-based radiography and computed tomography, X-ray refraction techniques are being increasingly used to detect damage in light materials. In fact, their range of application has been recently extended even to metals. The big advantage of X-ray refraction techniques is that they are able to detect nanometric defects, whose size would lie below the resolution of even state-of-the-art synchrotron-based X-ray computed tomography (SXCT). The superiority of synchrotron X-ray refraction radiography and tomography (SXRR and SXRCT) has been shown in the case of light materials, in particular composites. X-ray refraction techniques also yield a quantitifaction of the amount of damage (the so-called relative internal specific surface) and can well be compared with damage models. At the same time, it is impossible for SXRR and SXRCT to image single defects. We show that the combination of refraction- and transmission-based imaging techniques yields an impressive amount of additional information about the type and amount of defects in microstructured materials such as additively manufactured metals or metal matrix composites. We also show that the use of data fusion techniques allows the classification of defects in statistically significant representative volume elements.

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Section: Discussionmentioning

confidence: 99%

The combined use of X-ray refraction and transmission radiography and computed tomography

Bruno¹,

Laquai²,

Wieder³

et al. 2022

eJNDT

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“…The manufacturing of high‐quality glasses required for new applications (e.g., flat panel liquid crystal display (LCD) or plasma display panels) implies the development of new, high‐zirconia fused‐cast refractories with excellent thermomechanical properties. In this case study, [ 56 ] the evolution of thermal (coefficient of thermal expansion) and mechanical (Young's modulus) properties as a function of temperature and applied preload in a fused‐cast refractory ZrO 2 –SiO 2 composite was investigated. With the aid of SXRR (yielding the internal specific surface in materials), the evolution of microcracking as a function of thermal cycles (crossing the martensitic phase transformation of ZrO 2 around 1000 °C) under externally applied stress was monitored.…”

Section: Synchrotron X‐ray Refraction Radiography (Sxrr)mentioning

confidence: 99%

“…In fact, different kinds of defects appear if E v lies below or above the optimum laser energy density; unmolten powder particles, balling effect, and fusion defects appear if E v is too low, empty keyhole pores appear if E v is too high. Since with X-ray refraction it is possible to detect small inhomogeneities (voids or cracks) [56] Copyright 2019, MDPI.…”

Section: Distinguishing Unprocessed Powder From Empty Pores In Additi...mentioning

confidence: 99%

A Review of X‐Ray Imaging at the BAMline (BESSY II)

et al. 2023

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The hard X‐ray beamline BAMline at BESSY II (Berlin, Germany) has now been in service for 20 years. Several improvements have been implemented in this time, and this review provides an overview of the imaging methods available at the BAMline. Besides classic full‐field synchrotron X‐ray computed tomography (SXCT), also absorption edge CT, synchrotron X‐ray refraction radiography (SXRR), and synchrotron X‐ray refraction tomography (SXRCT) are used for imaging. Moreover, virtually any of those techniques are currently coupled in situ or operando with ancillary equipment such as load rigs, furnaces, or potentiostats. Each of the available techniques is explained and both the current and the potential usage are described with corresponding examples. The potential use is manifold, the examples cover organic materials, composite materials, energy‐related materials, biological samples, and materials related to additive manufacturing. The article includes published examples as well as some unpublished applications.

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“…Вид дилатометрических кривых для ZrO 2 , полученных в нашем исследовании (рис. 2), хорошо согласуется с литературными данными [16,35,36] моноклинной сингонии в этой области указывают, что это фазовые переходы 2-го рода [34]. Следовательно, присутствуют неизвестные полиморфные модификации ZrO 2 , существование которых в количестве не менее двух, предсказано в работах [32,33].…”

Section: дилатометрические измеренияunclassified

Фазовые переходы в моноклинном ZrO-=SUB=-2-=/SUB=-

Горелов¹,

Беляков²,

K.³

2023

Физика Твердого Тела

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Zirconia ZrO2 is one of the most important modern materials, but its use faces the problem of complex polymorphism. It is generally accepted that, under normal conditions, it exists in the monoclinic form P21/c, (No. 14), which undergoes an extended martensitic transformation into the tetragonal form P42/nmc (No. 137) when heated above 1000 ºС. However, the group-theoretic analysis forbids a direct transition between these space groups and requires at least two intermediate forms. The experiment carried out in this work using structure-sensitive methods (dilatometry and electrical conductivity) indeed revealed the existence of singular points on the temperature dependences of expansion and conductivity in the temperature range of 350±20 ºС and 730±20 ºС. This agrees with the literature data, which demonstrate singular points on the temperature dependences of the ZrO2 monoclinic lattice parameters. According to the dilatometry data, these transitions are phase transitions of the second order, which correlates with the obtained Raman data (measurements at temperatures up to 900 ºС in the range 60 – 900 cm-1), showing that the local structure changes slightly, therefore, the transitions occur within the framework of the monoclinic syngony.

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Evolution of Thermal Microcracking in Refractory ZrO2-SiO2 after Application of External Loads at High Temperatures

Cited by 13 publications

References 28 publications

The combined use of X-ray refraction and transmission radiography and computed tomography

The combined use of X-ray refraction and transmission radiography and computed tomography

A Review of X‐Ray Imaging at the BAMline (BESSY II)

Фазовые переходы в моноклинном ZrO-=SUB=-2-=/SUB=-

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