2017
DOI: 10.1016/j.ijrmhm.2017.03.004
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Evolution of plastic deformation in heavily deformed and recrystallized tungsten of ITER specification studied by TEM

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Cited by 42 publications
(23 citation statements)
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“…Polycrystalline W with purity of 99.97%, provided by Plansee AG as a bar with a square cross-section of 36 mm, was used in this study and in our previous works. Details about impurities and microstructure can be found in [30,31]. This material was fabricated by hammering on both sides.…”
Section: Materials and Experimental Procedures 21 Tungsten Wires Andmentioning
confidence: 99%
See 1 more Smart Citation
“…Polycrystalline W with purity of 99.97%, provided by Plansee AG as a bar with a square cross-section of 36 mm, was used in this study and in our previous works. Details about impurities and microstructure can be found in [30,31]. This material was fabricated by hammering on both sides.…”
Section: Materials and Experimental Procedures 21 Tungsten Wires Andmentioning
confidence: 99%
“…Grains with high misorientation angle are randomly oriented and are elongated with a size of 5-20 µm and 10-100 µm, normal and along to the bar axis, respectively. The presence and morphology of sub-grains was studied by transmission electron microscopy in [30], which revealed sub-grains (also elongated) with size varied in the range 0.6 -1.7 µm and 2.3 -4 µm, respectively, normal to and along the elongation directions. The dislocation density is found to be (4-8)×10 12 m -2 , depending on particular sub-grain and is being 4.5×10 12 m -2 on average.…”
Section: Materials and Experimental Procedures 21 Tungsten Wires Andmentioning
confidence: 99%
“…The occurrence of the grains might be either due to the non-completed recrystallization, thanks to potassium doping. But, it could also arise as a result of intensive plastic deformation which generates dislocation walls converting into low angle grain boundaries, as it was observed in bulk polycrystalline tungsten [27]. However, the clarification on the presence of grain boundaries requires further study, preferably by applying electron back scattering techniques as well as improvement of the FIB sample.…”
Section: Resultsmentioning
confidence: 99%
“…For the transversal cross-section of the wires samples with 5 mm length were prepared according to the standard metallographic procedures of cutting, grinding and polishing, as was earlier developed for other tungsten samples (see e.g. [17][18][19]). The samples were cut 15 to 25 mm away from the neck of the tested wire, and the analysis was performed in the center of the transversal cross-section.…”
Section: Sample Preparation Using Conventional Polishingmentioning
confidence: 99%