2008
DOI: 10.1109/jlt.2008.921914
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Evolution of Passive Optical Component Technologies for Fiber-Optic Communication Systems

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Cited by 26 publications
(9 citation statements)
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“…OAM light beams have azimuthal phase dependence given by exp(il ), in which 'l', the azimuthal mode order, corresponds to the number of 2 phase jumps across the wavefront of the OAM beam. This is similar in concept to the advantages that wavelength-selective networking and switching provided historically on top of simple wavelength multiplexed high-capacity point-to-point systems [8,9]. However, there might be a value in performing networking functions in the optical domain on OAM-based data channels.…”
Section: Introductionmentioning
confidence: 75%
“…OAM light beams have azimuthal phase dependence given by exp(il ), in which 'l', the azimuthal mode order, corresponds to the number of 2 phase jumps across the wavefront of the OAM beam. This is similar in concept to the advantages that wavelength-selective networking and switching provided historically on top of simple wavelength multiplexed high-capacity point-to-point systems [8,9]. However, there might be a value in performing networking functions in the optical domain on OAM-based data channels.…”
Section: Introductionmentioning
confidence: 75%
“…Furthermore, the main optical passive technologies are considered within the proposed framework to support the design of the network topology: power splitters and optical couplers, ADD/DROP multiplexers, multi-channel MUX/DEMUX, optical band-pass filters, etc. [72,73]. Figure 3 shows an example of a multi-level star-stars network topology designed with MUX/DEMUXES and optical couplers and splitters to support eight BSs distributed in two DL/UL land clusters with four BSs on each of them.…”
Section: Ne7: Odn Topologymentioning
confidence: 99%
“…on a silicon substrate. Thus, these basic components are fabricated and interconnected by wires [5]. In fact, in the silica waveguide components, the integrated circuit technology has strict requirements for thickness, refractive index, and residual stress of all the formed films.…”
Section: Introductionmentioning
confidence: 99%