2003
DOI: 10.1016/s0927-0248(02)00436-1
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Evolution of microstructure and phase in amorphous, protocrystalline, and microcrystalline silicon studied by real time spectroscopic ellipsometry

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Cited by 322 publications
(237 citation statements)
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“…In the case of nc-Si:H, the surface roughness is much larger that of a-Si:H and continues to increase with film thickness. 10 As the surface features increase in size, one EMA layer acting as a heterogeneous mixture is not sufficient to model the optical response of surface roughness, therefore this layer is divided into smaller sections as illustrated in Figure 2 …”
Section: Spectroscopic Ellipsometrymentioning
confidence: 99%
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“…In the case of nc-Si:H, the surface roughness is much larger that of a-Si:H and continues to increase with film thickness. 10 As the surface features increase in size, one EMA layer acting as a heterogeneous mixture is not sufficient to model the optical response of surface roughness, therefore this layer is divided into smaller sections as illustrated in Figure 2 …”
Section: Spectroscopic Ellipsometrymentioning
confidence: 99%
“…10 Si:H prepared by plasmaenhanced chemical vapor deposition (PECVD) may exhibit different growth regimesamorphous (a-Si:H), nanocrystalline (nc-Si:H), and mixed-phase (amorphous+nanocrystalline, a+nc-Si:H) -often within the same film as a function of thickness. Several structural transitions may occur during the growth evolution of Si:H. Initially, the film may nucleate as clusters of amorphous-or nanocrystalline-phase material on the substrate surface.…”
Section: Part 5: Microstructural Evolution Studies -In-situ Measuremementioning
confidence: 99%
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“…-the existence of a crystallization dynamics, i.e., the increase in crystallinity with the increase in film thickness [81];…”
Section: From Amorphous To Microcrystalline Silicon Films Exploiting mentioning
confidence: 99%