Evolution of INO Uncooled Infrared Cameras Towards Very High Resolution Imaging

Bergeron, Alain; Jerominek, Hubert; Chevalier, C.; Noc, Loïc Le; Tremblay, Bruno; Alain, Christine; Martel, Anne; Blanchard, Nathalie; Morissette, Martin; Mercier, Luc; Gagnon, Lise; Couture, Patrick; Desnoyers, Nichola; Demers, Mathieu; Lamontagne, Frédéric; Levesque, F.; Verreault, Sonia; Duchesne, François; Lambert, Julie; Girard, Martine; Savard, Maxime; Châteauneuf, François

doi:10.1088/1742-6596/276/1/012114

Cited by 2 publications

(1 citation statement)

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“…Additionally, testing systems for experimental microbolometric FPA prototypes in laboratories or research institutes are also indispensable to judge the performance characteristics of these prototypes. Some conventional testing systems for microbolometric FPA are complex and expensive like the FPA testing system in Sofradir in France, and other special testing systems such as the testing module in INO in Canada are simple and low-cost but inflexible to be applied to different kinds of microbolometric FPAs [1]. We have referred some kinds of testing benches for measuring and testing VO 2 -based FPA prototypes in our laboratory, and this has been reported in one of our previous published papers [2].…”

Section: Introductionmentioning

confidence: 99%

Low-Cost and Modularized Test Bench for Focal Plane Array

Chen

2014

AMR

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In this paper, a low-cost and modularized test bench for microbolometric focal plane array is proposed. Based on the analysis of driving microbolometric focal plane array, we have set up the simple test bench. The test bench consists of four major modules: optical part, driving sequence timer, power supply and signal processing board, and data analyzer. Each module in the test bench is reconfigurable and the driving sequence timer is programmable in system. The proposed test bench is low-cost and has been applied to practical microbolometric focal plane arrays in our laboratory.

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Section: Introductionmentioning

confidence: 99%