2016
DOI: 10.1016/j.jnucmat.2016.10.011
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Evolution of extended defects in polycrystalline Au-irradiated UO 2 using in situ TEM: Temperature and fluence effects

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Cited by 30 publications
(21 citation statements)
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“…Another possibility is that loops undergo unfaulting and/or loop merging, which results in decrease in loop density and has been previously reported especially when materials are subject to higher irradiation doses [89][90]. Nevertheless, the error bars for loop density estimation prevent us from concluding if any of these mechanisms are active in current work.…”
Section: Defect Evolutionmentioning
confidence: 78%
“…Another possibility is that loops undergo unfaulting and/or loop merging, which results in decrease in loop density and has been previously reported especially when materials are subject to higher irradiation doses [89][90]. Nevertheless, the error bars for loop density estimation prevent us from concluding if any of these mechanisms are active in current work.…”
Section: Defect Evolutionmentioning
confidence: 78%
“…The loop density increases with the irradiation fluence up to a saturation value, which depends on the temperature [22,23,25]. Then, a decrease occurs due to the formation of dislocation line.…”
Section: Discussionmentioning
confidence: 99%
“…Point defects generated by irradiation can cluster forming extended defects such as voids and dislocation loops. Several studies report the nucleation of dislocations loops at very low damage level [22][23][24][25][26]. For instance, Onofri et al have in situ observed the first dislocation loops nucleation under irradiation at -180°C with 0.39 MeV Xe ions from a damage level of around 0.008 dpa [25] (Fig.…”
Section: Discussionmentioning
confidence: 99%
“…The primary focus here will be key findings tied to ion beam irradiation studies. Ion beam irradiation has proven a flexible tool for the generation of defects found in real fuel [29,304,305,306,307,308,309,310,311,312,313,314,315,316,317,318,319,320,321,322,323,324,325,326,327,328].…”
Section: Crystalline Defect Generation Evolution and Characterizationmentioning
confidence: 99%