2021
DOI: 10.1021/acs.jpcc.1c00926
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Evidence of Piezoelectric Potential and Screening Effect in Single Highly Doped ZnO:Ga and ZnO:Al Nanowires by Advanced Scanning Probe Microscopy

Abstract: A complete study based on advanced atomic force microscopy (AFM) electrical mode called scanning spreading resistance microscopy (SSRM) is carried out on a series of samples of zinc oxide (ZnO) nanowires grown by chemical bath deposition (CBD) with different doping concentrations using gallium (Ga). The concentration of free charge carriers determined through SSRM signal calibration with a specific molecular beam epitaxy (MBE) grown multilayer structure with variation in each layer of electrically active Ga do… Show more

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Cited by 15 publications
(12 citation statements)
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“…It has been attributed to the higher residual doping obtained with ACG, with possibly an additional contribution of bending limitations due to the larger density of NWs on these ACG samples. More recently, this effect has been explored in a more quantitative way for ZnO NWs fabricated by chemical bath deposition (CBD) with different levels of Ga or Al doping using a combination of scanning spreading resistance microscopy and PFM in order to evaluate carrier concentration and piezoelectric response, respectively [17]. The PFM amplitude was divided by 2, from about 80 pm for non-intentionally Ga doped ZnO to about 40 pm for carrier concentrations above 2 × 10 19 cm −3 .…”
Section: Introductionmentioning
confidence: 99%
“…It has been attributed to the higher residual doping obtained with ACG, with possibly an additional contribution of bending limitations due to the larger density of NWs on these ACG samples. More recently, this effect has been explored in a more quantitative way for ZnO NWs fabricated by chemical bath deposition (CBD) with different levels of Ga or Al doping using a combination of scanning spreading resistance microscopy and PFM in order to evaluate carrier concentration and piezoelectric response, respectively [17]. The PFM amplitude was divided by 2, from about 80 pm for non-intentionally Ga doped ZnO to about 40 pm for carrier concentrations above 2 × 10 19 cm −3 .…”
Section: Introductionmentioning
confidence: 99%
“…The high concentration of Al Zn and Ga Zn shallow donors due to their low formation energy [66,67] certainly explains their even higher free electron density as reported in Ref. [45]. However, a significant part of Al dopants is expected to lie on the interstitial sites [68].…”
Section: Spectroscopic Propertiesmentioning
confidence: 75%
“…The physicochemical processes at work following the addition of Al nitrate and Ga nitrate in the bath have been studied in detail, along with the CBD conditions required to favor the incorporation of dopants through attractive electrostatic interactions [42][43][44]. The doping control in ZnO NWs grown by CBD has thus offered recently a greater promise to precisely determine its effect on the performance of devices, in particular in the field of piezoelectric applications [45]. However, no investigation has been reported so far about the effect of the doping with Al and Ga using the approach in Refs.…”
Section: Introductionmentioning
confidence: 99%
“…The incorporation of Al and Ga dopants into ZnO NWs has been found to operate in a narrow range of high pH values following attractive electrostatic forces between the anion complexes containing the dopant (i.e., Al(OH) 4 − and Ga-(OH) 4 − ) and the positively charged m-plane sidewalls. 21,22 The resulting free electron density in ZnO NWs has accordingly been shown to drastically increase following the doping with Al and Ga. 24 These studies have revealed that the implementation of the doping of ZnO NWs by CBD should be optimized for each dopant considered although some general thermodynamic considerations hold for all dopants. In that way, there could be an opportunity to obtain codoped ZnO NWs with Al and Ga by optimizing the conditions during the CBD process.…”
Section: Introductionmentioning
confidence: 99%