2010
DOI: 10.1103/physrevb.82.165105
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Evidence of charge disproportionation on the nickel sublattice inEuNiO3thin films: X-ray photoemission studies

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Cited by 13 publications
(13 citation statements)
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“…H. K. Yoo, et al observed the strain dependent FS superstructures in LaNiO 3 films [32], which may be due to the modification in the low-lying orbitals and crystal field splitting. It has been suggested that the existence of charge disproportionation in RNiO 3 is strongly related to the metal-insulator phase transition [26][27][28][29]. Our ARPES results on two differently strained films suggest the existence of a tunable electronic localization.…”
Section: Discussionmentioning
confidence: 49%
See 1 more Smart Citation
“…H. K. Yoo, et al observed the strain dependent FS superstructures in LaNiO 3 films [32], which may be due to the modification in the low-lying orbitals and crystal field splitting. It has been suggested that the existence of charge disproportionation in RNiO 3 is strongly related to the metal-insulator phase transition [26][27][28][29]. Our ARPES results on two differently strained films suggest the existence of a tunable electronic localization.…”
Section: Discussionmentioning
confidence: 49%
“…Experimentally, it is reported that the MIT temperature coincides with the Néel temperature T N depending on the ionic radius of R [4,5]. More recently, various groups have claimed that the MIT originates from the formation of charge-order due to NiO 6 octahedral distortions [25] or valence fluctuations between Ni 3+δ and Ni 3−δ ions [26][27][28][29]. An observed isotope effect supports this scenario [30].…”
Section: Introductionmentioning
confidence: 85%
“…The density of states (DOS) of the valence band is closely related to the measured photoelectron intensity (spectral weight), and changes in the latter can be related to the opening of a gap during the MIT 19 , variation of the bandwidth 20 or the transfer of spectral weight between different parts of the valence band 21 . Photoemission measurements on RNiO 3 have been performed on polycrystalline samples [22][23][24][25][26] as well as on thin films [27][28][29][30] . Measurements on thin films, however, were only conducted using the relatively low resolution xray photoemission spectroscopy (XPS).…”
Section: Introductionmentioning
confidence: 99%
“…Several recent publications detail the growth of thin film nickelates by metal-organic chemical vapor deposition and sputtering [15][16][17][18]. Recently thick (∼210 nm) ENO films have been grown by rf magnetron sputtering [19], but x-ray diffraction revealed an essentially textured structure of the samples.…”
mentioning
confidence: 99%