The temperature dependence of the resistance R(T ) of ultrathin quench-condensed films of Ag, Bi, Pb and Pd has been investigated. In the most resistive films films, R(T ) = R0 exp (T0/T ) x , where x = 0.75 ± 0.05. Surprisingly, the exponent x was found to be constant for a wide range of R0 and T0 in all four materials, possibly implying a consistent underlying conduction mechanism. The results are discussed in terms of several different models of hopping conduction.