2014
DOI: 10.1364/ome.4.002484
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Evidence for a dispersion relation of optical modes in the cuticle of the scarab beetle Cotinis mutabilis

Abstract: Variable angle Mueller matrix spectroscopic ellipsometry is used to study the properties of light reflected from the exoskeleton (cuticle) of the scarab beetle Cotinis mutabilis. For unpolarized incident light, the ellipticity and degree of polarization of the reflected light reveal a left-handed helical structure in the beetle cuticle. Analysis of the spectral position of the maxima and minima in the interference oscillations of the Mueller-matrix elements provides evidence for a dispersion relation similar t… Show more

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Cited by 18 publications
(28 citation statements)
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“…For opaque cuticles like in C. aurata the oscillations become very weak or vanish completely. However, if sufficiently large they can be used to determine cuticle thickness and also to explore cuticle structure [21,22].…”
Section: Discussionmentioning
confidence: 99%
See 1 more Smart Citation
“…For opaque cuticles like in C. aurata the oscillations become very weak or vanish completely. However, if sufficiently large they can be used to determine cuticle thickness and also to explore cuticle structure [21,22].…”
Section: Discussionmentioning
confidence: 99%
“…At both wavelengths, large negative values on m 41 and m 14 elements are observed. The remaining off-diagonal elements are small as well as elements m 22 and m 33 whereas m 44 is large and positive. The Mueller matrices thus exhibit properties of a circular polarizer.…”
Section: Primary Data -Examplesmentioning
confidence: 99%
“…The Chrysina genus is of particular interest since circular polarization effects have been observed in several of its many species and it was in this genus these effects were first observed. However, it should be pointed out that circular polarization effects have been observed in beetles in other subfamilies like the Cetoniinae [16,21,26]. Using Mueller-matrix spectroscopic ellipsometry (MMSE) [27] in combination with structural characterization by optical microscopy and cross-sectional scanning electron microscopy (SEM) we find that, even if there is a variation in the visual coloration and patterning of the beetles, it is possible to classify the Chrysina beetles according to two major types of polarization responses connected to two different exocuticle structures.…”
Section: Introductionmentioning
confidence: 99%
“…The high reflectance observed in some beetles is due to both a large number of layers in their exoskeleton and a relative high birefringence. The latter property has a strong influence on the penetration depth of the selectively reflected mode [24].…”
Section: Anisotropic Multilayer Structuresmentioning
confidence: 99%
“…Different pitch profiles have been observed in the cuticle of beetles [24,83]. The graded pitch profile plays an important role in the polarization properties of the reflected light.…”
Section: Cuticlementioning
confidence: 99%