2009
DOI: 10.1016/j.tsf.2009.02.020
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Evaluation of Y2O3 gate insulators for a-IGZO thin film transistors

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Cited by 85 publications
(57 citation statements)
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“…Depending the deposition condition and method, the range of dielectric constant values for Y 2 O 3 have been reported. In our study, the dielectric constant of 15 for as-deposited Y 2 O 3 at 120 W RF power and 1:1; Ar to O 2 ratio has been reported [8]. However, the fabricated devices are annealed in the ambient of N 2 + 5% H 2 at 400 8C for 2 h. Thus, it is essential to evaluate performance of gate oxide.…”
Section: Resultsmentioning
confidence: 80%
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“…Depending the deposition condition and method, the range of dielectric constant values for Y 2 O 3 have been reported. In our study, the dielectric constant of 15 for as-deposited Y 2 O 3 at 120 W RF power and 1:1; Ar to O 2 ratio has been reported [8]. However, the fabricated devices are annealed in the ambient of N 2 + 5% H 2 at 400 8C for 2 h. Thus, it is essential to evaluate performance of gate oxide.…”
Section: Resultsmentioning
confidence: 80%
“…The dielectric constant which has been used to determine the mobility is an average value measured on five different devices. The leakage current density for as-deposited Y 2 O 3 has been reported to be 10 À9 A/cm 2 for 100 nm thick layer [8]. The observed gate leakage current density on the deterioration of Y 2 O 3 is higher by the 10 order of magnitude compare to the MIM structure.…”
Section: Resultsmentioning
confidence: 94%
“…La 2 O 3 has a very high subthreshold slope of 1.2 V/decade and hence the electrical performance will be poorer in comparison to others. Figure 5 shows the relationship between threshold voltage and dielectric constant based on the data obtained in [5][6][7][8][9][10][11]. The values are highly scattered as threshold voltage depends on some other factors also.…”
Section: Resultsmentioning
confidence: 99%
“…Hence we found that HfO 2 , Y 2 O 3 , La 2 O 3 and ZrO 2 are the possible candidates that satisfy the constraints of high dielectric constant and a considerable band gap and conduction band offset. Figure 4 shows the relationship between subthreshold slope and and dielectric constant based on the data obtained in [5][6][7][8][9][10][11]. It can be observed that all the materials except La 2 O 3 have subthreshold slope lying in the range of .18-.23 V/decade.…”
Section: Discussionmentioning
confidence: 99%
“…투명박막트랜지스터의 성능개선과 함께 투명집적회 로의 실현이 기대되고 있다 [1,2]. 투명집적회로가 개 발되기 위해서는 투명박막트랜지스터와 같은 능동소 자뿐만 아니라 투명저항과 같은 수동소자의 개발도 요구된다.…”
Section: 서 론 1)unclassified