“…It is also known that the residual stress values of SOFC electrodes (or any other materials) are very much dependent upon the measurement method (e.g. X-ray diffraction [2,[4][5][6][7][8][9][10][11][12][13][14][15][16][17], synchrotron X-ray radiation [18][19][20][21], curvature method [15,[22][23][24][25][26], finite element [27,28], numerical [16,29], focused ion beam milling and digital image correlation [30], white light interferometry [25], nanoindentation [25,28], and neutron diffraction [31] methods). Furthermore, thermal spray deposition processes due to high cooling rates of the impacting particles (lamella) impart residual stress in the layered SOFC materials and hence influence the durability and efficiency of the cell.…”