1994
DOI: 10.1016/0304-3991(94)90050-7
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Evaluation of the probing profile of scanning force microscopy tips

Abstract: It is demonstrated that a high-temperature-treated (305) surface of a SrTiO 3 crystal can be used to evaluate the probing profile of AFM tips routinely, to provide a means of selecting perfect tips and to evaluate possible image distortions. This is important in order to recognize typical AFM artifacts which are caused by tips with truncated or twinned peaks which occur rather often in the case of microfabricated AFM needles. By means of selected needles, it is shown that also defective tips can give apparentl… Show more

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Cited by 40 publications
(26 citation statements)
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References 21 publications
(26 reference statements)
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“…Experimental and Theoretical Aspects of the Modern Nanotribology Some of the measurements have revealed double tips and other unsuitable tip structures [118,119]. Thus, tip characterization is absolutely necessary for AFM imaging, precise determination of the forces and nanotribology experiments.…”
Section: Problems Of Tip Characterization and Force Calibrationmentioning
confidence: 99%
“…Experimental and Theoretical Aspects of the Modern Nanotribology Some of the measurements have revealed double tips and other unsuitable tip structures [118,119]. Thus, tip characterization is absolutely necessary for AFM imaging, precise determination of the forces and nanotribology experiments.…”
Section: Problems Of Tip Characterization and Force Calibrationmentioning
confidence: 99%
“…Probing a polymer surface in the con-Fax: +49-731-502 2883 tact mode of SFM often leads to blurred and smeared images because the surface of the relatively soft polymers becomes deformed upon interaction with the probe [21,22]. Suitable tips can be selected routinely by means of a well-defined stepped single-crystal surface [24]. Suitable tips can be selected routinely by means of a well-defined stepped single-crystal surface [24].…”
Section: Introductionmentioning
confidence: 99%
“…Additionally, blunt tips are unable to reach down into narrow valleys to image the surface at the bottom of these valleys. These and other artefacts originating from convolution of the tip shape with the surface topography have been discussed elsewhere [224][225][226].…”
Section: Calibration Of the Tip Shapementioning
confidence: 97%